Enhancing System Reliability with Digital Twins and Silicon Lifecycle Management (SLM)

Enhancing System Reliability with Digital Twins and Silicon Lifecycle Management (SLM)
by Kalar Rajendiran on 12-09-2024 at 6:00 am

Synopsys SLM Solution Components

As industries become more reliant on advanced technologies, the importance of ensuring the reliability and longevity of critical systems grows. Failures in components, whether in autonomous vehicles, high performance computing (HPC), healthcare devices, or industrial automation, can have far-reaching consequences.… Read More


TSMC’s Reliability Ecosystem

TSMC’s Reliability Ecosystem
by Tom Dillinger on 04-06-2022 at 10:00 am

AC accelerated stress conditions

TSMC has established a leadership position among silicon foundries, based on three foundational principles:

  • breadth of technology support
  • innovation in technology development
  • collaboration with customers

Frequent SemiWiki readers have seen how these concepts have been applied to the fabrication and packaging technology… Read More


Advanced Process Development is Much More than just Litho

Advanced Process Development is Much More than just Litho
by Tom Dillinger on 12-16-2020 at 10:00 am

Vt distribution

The vast majority of the attention given to the introduction of each new advanced process node focuses on lithographic updates.  The common metrics quoted are the transistors per mm**2 or the (high-density) SRAM bit cell area.  Alternatively, detailed decomposition analysis may be applied using transmission electron microscopy… Read More


Electrical Reliability Verification – Now At FullChip

Electrical Reliability Verification – Now At FullChip
by Alex Tan on 04-25-2018 at 12:00 pm

Advanced process technology offers both device and interconnect scaling for increased design density and higher performance while invoking also significant implementation complexities. Aside from the performance, power and area (PPA) aspects, designer is getting entrenched with the need of tackling more reliability … Read More


Robust Reliability Verification – A Critical Addition To Baseline Checks

Robust Reliability Verification – A Critical Addition To Baseline Checks
by Alex Tan on 03-01-2018 at 12:00 pm

Design process retargeting is acommon recurrence based on scaling orBOM(Bill-Of-Material) cost improvement needs. This occursnot only with the availability of foundry process refresh to a more advanced node,but also to any new derivative process node tailored towards matching design complexity, power profile or reliabilityRead More


Noise, The Need for Speed, and Machine Learning

Noise, The Need for Speed, and Machine Learning
by Riko Radojcic on 05-08-2017 at 7:00 am

Technology trends make the concerns with electronic noise a primary constraint that impacts many mainstream products, driving the need for “Design-for-Noise” practices. That is, scaling, and the associated reduction in the device operating voltage and current, in effect magnifies the relative importance of non-scalableRead More


Predicting Lifetime of Analog ICs

Predicting Lifetime of Analog ICs
by Pawan Fangaria on 06-22-2015 at 12:30 pm

With the increase of transistors per unit area, high density interconnects and manufacturing variability at lower nodes, the electronic devices have become more vulnerable to failures. The devices that operate under extreme conditions such as automotive devices that operate at high temperatures need to be robust enough to… Read More


Stop TDDB from getting through peanut butter

Stop TDDB from getting through peanut butter
by Don Dingee on 01-24-2014 at 6:00 pm

There are a few dozen causes of semiconductor failure. Most can be lumped into one of three categories: material defects, process or workmanship issues, or environmental or operational overstress. Even when all those causes are carefully mitigated, one factor is limiting reliability more as geometries shrink – and it… Read More