Analytics and Visualization for Big Data Chip Analysis

Analytics and Visualization for Big Data Chip Analysis
by Tom Dillinger on 08-28-2018 at 12:00 pm

Designers require comprehensive logical, physical, and electrical models to interpret the results of full-chip power noise and electromigration analysis flows, and subsequently deduce the appropriate design updates to address any analysis issues. These models include: LEF, DEF, Liberty library models (including detailed… Read More


Big Data Analytics and Power Signoff at NVIDIA

Big Data Analytics and Power Signoff at NVIDIA
by Bernard Murphy on 11-23-2017 at 7:00 am

While it’s interesting to hear a tool-vendor’s point of view on the capabilities of their product, it’s always more compelling to hear a customer/user point of view, especially when that customer is NVIDIA, a company known for making monster chips.


A quick recap on the concept. At 7nm, operating voltages are getting much closer… Read More


Big Data and Power Integrity: Drilling Down

Big Data and Power Integrity: Drilling Down
by Bernard Murphy on 08-21-2017 at 7:00 am

I’ve written before about how Ansys applies big data analytics and elastic compute in support of power integrity and other types of analysis. A good example of the need follows this reasoning: Advanced designs today require advanced semiconductor processes – 16nm and below. Designs at these processes run at low voltages, much… Read More


Margin Call

Margin Call
by Bernard Murphy on 06-04-2017 at 7:00 am

A year ago, I wrote about Ansys’ intro of Big Data methods into the world of power integrity analysis. The motivation behind this advance was introduced in another blog, questioning how far margin-based approaches to complex multi-dimensional analyses could go. An accurate analysis of power integrity in a complex chip should… Read More