Ansys’ Emergence as a Tier 1 EDA Player— and What That Means for 3D-IC

Ansys’ Emergence as a Tier 1 EDA Player— and What That Means for 3D-IC
by Daniel Nenni on 09-20-2022 at 10:00 am

Ansys chip package board

Over its 40+ year history, electronic design automation (EDA) has seen many companies rise, fall, and merge. In the beginning, in the 1980s, the industry was dominated by what came to be known as the big three — Daisy Systems, Mentor Graphics, and Valid Logic (the infamous “DMV”). The Big 3 has morphed over the years, eventually settling… Read More


Multiphysics, Multivariate Analysis: An Imperative for Today’s 3D-IC Designs

Multiphysics, Multivariate Analysis: An Imperative for Today’s 3D-IC Designs
by Daniel Nenni on 06-26-2022 at 6:00 am

Ansys Heat Map

Semiconductor manufacturers are under constantly increasing and intense pressure to accelerate innovative new chip designs to market faster than ever in smaller package sizes while assuring signal integrity and reducing power consumption. Three-dimensional integrated circuits (3D-ICs) promise to answer all these demands… Read More


Electrothermal Signoff for 2.5D and 3D-IC Systems

Electrothermal Signoff for 2.5D and 3D-IC Systems
by Daniel Nenni on 02-04-2021 at 6:37 pm

System-in-package (SiP) designs for high-performance computing (HPC), high-speed networking, and AI applications are extremely complex. To achieve maximum performance without exceeding tight thermal and power constraints, these chips must be designed within the context of the package and the overall system. Ansys 2.5D/3D-IC… Read More


Electrothermal Signoff for 2.5D and 3D-IC Systems

Electrothermal Signoff for 2.5D and 3D-IC Systems
by Daniel Nenni on 02-04-2021 at 3:18 am

System-in-package (SiP) designs for high-performance computing (HPC), high-speed networking, and AI applications are extremely complex. To achieve maximum performance without exceeding tight thermal and power constraints, these chips must be designed within the context of the package and the overall system. Ansys 2.5D/3D-IC… Read More


Analytics and Visualization for Big Data Chip Analysis

Analytics and Visualization for Big Data Chip Analysis
by Tom Dillinger on 08-28-2018 at 12:00 pm

Designers require comprehensive logical, physical, and electrical models to interpret the results of full-chip power noise and electromigration analysis flows, and subsequently deduce the appropriate design updates to address any analysis issues. These models include: LEF, DEF, Liberty library models (including detailed… Read More


Big Data Analytics and Power Signoff at NVIDIA

Big Data Analytics and Power Signoff at NVIDIA
by Bernard Murphy on 11-23-2017 at 7:00 am

While it’s interesting to hear a tool-vendor’s point of view on the capabilities of their product, it’s always more compelling to hear a customer/user point of view, especially when that customer is NVIDIA, a company known for making monster chips.


A quick recap on the concept. At 7nm, operating voltages are getting much closer… Read More


Big Data and Power Integrity: Drilling Down

Big Data and Power Integrity: Drilling Down
by Bernard Murphy on 08-21-2017 at 7:00 am

I’ve written before about how Ansys applies big data analytics and elastic compute in support of power integrity and other types of analysis. A good example of the need follows this reasoning: Advanced designs today require advanced semiconductor processes – 16nm and below. Designs at these processes run at low voltages, much… Read More


Margin Call

Margin Call
by Bernard Murphy on 06-04-2017 at 7:00 am

A year ago, I wrote about Ansys’ intro of Big Data methods into the world of power integrity analysis. The motivation behind this advance was introduced in another blog, questioning how far margin-based approaches to complex multi-dimensional analyses could go. An accurate analysis of power integrity in a complex chip should… Read More