Jitter: The Overlooked PDN Quality Metric

Jitter: The Overlooked PDN Quality Metric
by Admin on 06-30-2025 at 6:00 am

Figure 1 – Accumulated jitter

The most common way to evaluate a power distribution network is to look at its impedance over the effective frequency range. A lower impedance will produce less noise when transient current is demanded by the IC output buffers. However, this transient current needs to be provided at the same time for each transition or jitter will… Read More


High-speed PCB Design Flow

High-speed PCB Design Flow
by Daniel Payne on 04-24-2025 at 10:00 am

PCB design phases min

High-speed PCB designs are complex, often requiring a team with design engineers, PCB designers and SI/PI engineers working together to produce a reliable product, delivered on time and within budget. Cadence has been offering PCB tools for many years, and they recently wrote a 10-page white paper on this topic, so I’ll share … Read More


Going Beyond DRC Clean with Calibre DE

Going Beyond DRC Clean with Calibre DE
by Mike Gianfagna on 03-24-2025 at 6:00 am

Going Beyond DRC Clean with Calibre DE

For advanced semiconductor designs, achieving both design rule check clean layouts and optimal electrical performance is crucial for minimizing design iterations, reducing time-to-market and ensuring product reliability. Balancing electrical performance and layout integrity is a difficult task. Achieving an optimal… Read More


SI and PI Update from Cadence on Sigrity X

SI and PI Update from Cadence on Sigrity X
by Daniel Payne on 10-22-2024 at 10:00 am

Sigrity X

Signal Integrity (SI) and Power Integrity (PI) issues are critical to analyze, ensuring the proper operation of PCB systems and IC packages, yet the computational demands from EDA tools can cause engineers to only analyze what they deem are critical signals, instead of the entire system. Cadence has managed to overcome this SI/PI… Read More


Synopsys Enhances PPA with Backside Routing

Synopsys Enhances PPA with Backside Routing
by Mike Gianfagna on 03-19-2024 at 6:00 am

Comparison of frontside and backside PDNs (Source IMEC)

Complexity and density conspire to make power delivery very difficult for advanced SoCs. Signal integrity, power integrity, reliability and heat can seem to present unsolvable problems when it comes to efficient power management. There is just not enough room to get it all done with the routing layers available on the top side… Read More


On-Chip Power Distribution Networks Get Help from Magwel’s RNi

On-Chip Power Distribution Networks Get Help from Magwel’s RNi
by Tom Simon on 02-02-2017 at 12:00 pm

Counting squares is a useful tool for calculating simple resistance in wires, but falls short in reality when wires deviate from ideal. Frequently the use of RC extraction tools for determining resistance in signal lines in digital designs can be effective and straightforward. However, there are classes of nets in designs that… Read More


DesignCon 2016 — signal integrity must be power-aware!

DesignCon 2016 — signal integrity must be power-aware!
by Tom Dillinger on 01-31-2016 at 6:00 pm

DesignCon is a unique conference — its tagline is “Where the Chip meets the Board”. Held each January in Santa Clara, the conference showcases a wealth of new technologies for advanced packaging, printed circuit board fabrication, connectors, cables, and related analysis equipment (e.g, BERT, VNA, scopes). Of specific… Read More


ANSYS Enters the League of 10nm Designs with TSMC

ANSYS Enters the League of 10nm Designs with TSMC
by Pawan Fangaria on 04-09-2015 at 7:00 pm

The way we are seeing technology progression these days is unprecedented. It’s just about six months ago, I had written about the intense collaboration between ANSYSand TSMCon the 16nm FinFET based design flow and TSMC certifying ANSYS tools for TSMC 16nm FF+ technology and also conferring ANSYS with “Partner of the Year” award.… Read More


Noise & Reliability of FinFET Designs – Success Stories!

Noise & Reliability of FinFET Designs – Success Stories!
by Pawan Fangaria on 11-01-2014 at 7:00 am

I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More