IC designers use EDA tools to implement their logical and physical design, and these tools require foundry-specific information for:
I’ve been quite impressed that modern ICs use a lithography process with 193nm light sources to resolve final feature sizes at 20nm and smaller dimensions. We’ve been blogging about Double Patterning Technology (DPT) some 45 times in the past few years that enable 20nm fabrication, so one big question for me is, “How… Read More
Analog IC designers are gradually adopting what digital IC designers have been doing for years, metric driven verification. When you talk with analog designers about their methodology and approach, you hear terms like artisan being used which implies mostly a manually-oriented methodology. Thanks to automation from EDA companies,… Read More
Why do all three big EDA companies have user group meetings in India? The answer is to grow the EDA market in India because so many multi-national companies have engineers in India doing SoC, and IP design work. In my 35 years of IC design and EDA experience I’ve had the pleasure of working with and knowing many engineers and managers… Read More
You can often tell how important blogging and social media is to an EDA company by how much effort it takes to find their blog from the Home page. For the folks at Mentor Graphics I’d say that blogging is quite important, because it shows up as a top-level menu item. Notice also how important Twitter is, their latest tweets show… Read More
Speaking from experience, it is very difficult to get an OEM customer to talk about how they actually use standards and vendor products. A new white paper co-authored by Broadcom lends insight into how a variety of technologies combine in a flow from IP block simulation verification with assertions to complete SoC emulation with… Read More
In the world of IC testability we tend to look at various approaches as independent means to an end, namely high test coverage with the minimum amount of test time, minimum area impact, minimum timing impact, and acceptable power use. Automatic Test Pattern Generation (ATPG) is a software-based approach that can be applied to any… Read More
The tech standards cycle almost always goes like this: Problems or limits develop with the existing way of doing things. Innovators attempt to engineer solutions, usually many of them. Chaos ensues when customers figure out nothing new works with anything else. Competitors sit down and agree on a specification where things work… Read More
Through my contacts at SemiWiki I was introduced to a mixed signal IP company named SilabTech, and then decided to interview the founder and CEO, Sujoy Chakravarty.
Sujoy Chakravarty, CEO and Founder
… Read More
Yesterday at SEMICON West I attended an interesting talk about how to use the masses of die test data to improve silicon yield. The speaker was Dr. Martin Keim, from Mentor Graphics.
First of all, he pointed out that with advanced process nodes (45nm, 32nm, and 28nm), and new technologies like FinFETs, we get design-sensitive defects.… Read More
