Verifying the Electrostatic Discharge (ESD) protection network on an IC can be challenging, and if it is not done correctly it can lead to failures on the tester, reduced product reliability or shortened field life. In this webinar you will learn how Magwel’s ESDi thoroughly analyzes all pad combinations in a design for comprehensive… Read More
High performance power transistors are used in power management ICs, where switching behavior is extremely important. However, due to their large distributed gate and active area structure, accurately simulating switching activity to improve performance and minimize switching power loss can be challenging. Uncorrected… Read More
Magwel is offering a webinar that takes a deeper look at how Power Transistors can be more accurately simulated in converter circuits to provide extremely accurate information about switching efficiency. DC converter circuit efficiency has a big effect on the battery life of mobile devices and can affect performance and efficiency… Read More
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PowerMOS devices play a major role in a variety of power converter and control circuits. Some examples of their applications include PMICs or boost and buck converters. Often these are used in mobile and IoT devices to convert battery voltages to circuit operating voltages. Analysis tools… Read More
PowerMOS devices play a major role in a variety of power converter and control circuits. Some examples of their applications include PMICs, or boost and buck converters. Often these are used in mobile and IoT devices to convert battery voltages to circuit operating voltages.
Due to their size and internal complexity PowerMOS … Read More
The symbol for a PowerMOS device in a converter circuit schematic looks simple enough. However, it belies a great deal of hidden complexity. A single device is actually a huge array of parallel intrinsic devices connected together to act as a single high power device. While their gate lengths are small, as with many other MOS devices,… Read More
Failures during manufacturing and assembly or in the field caused by charged device model (CDM) type ESD events are a serious concern for IC design teams. CDM failures are generally caused by charge build-up on device packages, which capacitively charge large internet nets, such as GND or VSS. Once a device pin contacts a current… Read More
Webinars have been a popular form of communication since even before SemiWiki existed and they are a mainstay in today’s fast-moving semiconductor ecosystem.
In the past, SemiWiki has assisted with more than a hundred webinars. Today SemiWiki can do a complete webinar from start to finish using the GotoWebinar software. SemiWiki… Read More
During my trip through Asia last week I attended the Taiwan ESD Workshop. Hsinchu is densely populated with some of the smartest semiconductor people in the world so it is well worth the trip, absolutely. As it turns out ESD is one of the top concerns in semiconductor design and manufacture. The current rule based and simulation … Read More
In the realm of ESD protection, Charged Device Model (CDM) is becoming the biggest challenge. Of course, Human Body Model (HBM) is still essential, and needs to be used when verifying chips. However, a number of factors are raising the potential losses that CDM events can cause relative to HBM. These factors fall into two categories:… Read More