The Tale of Three Metrics
Meeting PPA (Performance, Power and Area) target is key to a successful design tapeout. These mainstream QoR (Quality of Results) metrics are rather empirical yet inter-correlated and have been expanded to be linked with other metrics such as yield, cost and reliability. While the recent CPU performance… Read More
As a blogger in the EDA industry I get more invitations to meet with folks at DAC than I have time slots, so I have to be a bit selective in who I meet. When the folks at Cadence asked me to sit down and chat with Mladen Nizic I was intrigued because Mladen is so well-known in the AMS language area and he’s one of the authors of, The Mixed-Signal… Read More
Over a decade ago, a group of semiconductor industry experts published a landmark paper as part of the periodic updates to the International Technology Roadmap for Semiconductors, or ITRS for short (link). The ITRS identified a critical design productivity gap. The circuit capacity afforded by the Moore’s Law pace of technology… Read More
With the increasing complexity and diversity of the mechanical constraints and electrical requirements in electronic product development, printed circuit board designers are faced with a number of difficult challenges:
“Testing can only prove the presence of bugs, not their absence,” stated the famous computer scientist Edsger Dijkstra. That notion rings true to the many college participants of the Hack@DAC competition offered during DAC 2018 in San Francisco. The goal of this competition is to develop tools and methods for identifying security… Read More
I attended on Monday, June 25, DAC’s Opening Day, a Cadence-sponsored Lunch panel. Ann Steffora Mutschler (Semiconductor Engineering) was the Moderator and the Panelists were Jim Hogan (Vista Ventures), David Lacey (HP Enterprise), Shigeo Oshima (Toshiba Memory Corp), Paul Cunningham (Cadence).… Read More
A chain is as strong as its weakest link. This phrase resonates well in Static Timing Analysis (STA) domain, though it is about accuracy rather than durability. As timing signoff step provides the final performance readings of a design, an STA outcome is as good as its underlying components. Aside from the parasitic extraction … Read More
The venue
Despite of being held at the new three-story Moscone West building, this year 55th DAC in San Francisco bore many similarities as compared with last year’s. Similar booth decors and floorplan positioning of the big two, Synopsys and Cadence, which were across of each other and right next to the first floor entrance –although… Read More
This week Cadence introduced Legato™ Reliability Solution, intended to address increased challenges in designing high-reliability analog and mixed-signal ICs for automotive, industrial, aerospace and defense applications.… Read More
One of the more frequent questions I get, “What is next after FinFETs?” is finally getting answered. Thankfully I am surrounded by experts in the process technology field including Scotten Jones of IC Knowledge. I am also surrounded by design enablement experts so I really am the man in the middle which brings us to a discussion between… Read More
