During DVCon 2018 in San Jose, one topic widely covered was the necessity of describing and capturing intent. Defining our design intent up-front is crucial to the overall success of a design implementation. It is not limited to applying a process level intent, such as the use of verification intent with embedded assertions in … Read More
EDA CEO Outlook 2018
The EDA CEO outlook took an interesting turn last night but before I get into that I will offer a few comments about the start of the show. I attend this event every year for the content but also for the networking. It isn’t everyday you get to hang out with semiconductor industry elite and have candid conversations over food and drinks.… Read More
FlexE at SoC IP Days with Open Silicon
On Thursday April 5th the Design and Reuse SoC IP days continues in Santa Clara at the Hyatt Regency (my favorite hangout). SemiWiki is a co-sponsor and I am Chairman of the IP Security Track. More than 400 people have registered thus far and I expect a big turnout, if you look at the program you will see why. You should also know that registration… Read More
Aart de Geus At the Heart of Impact!
At the Silicon Valley SNUG 2018, Synopsys Chairman and co-CEO Dr. Aart de Geuss gave his keynote speech addressing attendees on how far we have evolved, and at times encountered the aha factor that helps propel us to the next level. He explored trends as well as the current state of his company solution offerings.
Moore’s Law, Digital… Read More
Free Webinar: Silvaco 3D Solver Based Extraction for Device and Circuit Designers
Designers spend a lot of time looking at their layouts in 2D. This is done naturally because viewing in 2D is faster and simpler than in 3D. It helps that humans are good at extrapolating from 2D to 3D. Analysis software, such as extraction software also spend a lot of time looking at layouts in 2D. While this is fine for approximate results,… Read More
Don’t Stand Between The Anonymous Bug and Tape-Out (Part 2 of 2)
The second panel is about system coverage and big data. Coverage metrics have been used to gauge the quality of verification efforts during development. At system level, there are still no standardized metrics to measure full coverage. The emergence of PSS, better formal verification, enhanced emulation and prototyping techniques… Read More
Webinar Alert – Embedded Monitoring of Process and Voltage in SoCs
In the old days to learn about new semiconductor IP you would have to schedule a sales call, listen to the pitch, then decide if the IP was promising or not. Today we have webinars which offer a lot less drama than a sales call, plus you get to ask your questions by typing away at the comfort of your desk, hopefully wearing headphones as … Read More
An Advanced-User View of Applied Formal
Thanks to my growing involvement in formal (at least in writing about it), I was happy to accept an invite to this year’s Oski DVCon dinner / Formal Leadership Summit. In addition to Oski folks and Brian Bailey (an esteemed colleague at another blog site, to steal a Frank Schirrmeister line), a lively group of formal users attended… Read More
Students Should Attend DAC in SFO
On LinkedIn I have some 2,116 connections and many of those are students looking to enter the field of EDA, IP or semiconductor design. What a wonderful opportunity these students have by attending the 55th annual DAC in San Francisco this summer from June 24-28. Technical sessions, keynote speeches, exhibitors, networking, … Read More
SPIE Advanced Lithography 2018 – EUV Status
This year the Advanced Lithography Conference felt very different to me than the last couple of years. I think it was Chris Mack who proclaimed it the year of Stochastics. EUV has dominated the conference for the last several years but in the past the conversation has been mostly centered on the systems, system power and uptime.
I … Read More
Rapidus, IBM, and the Billion-Dollar Silicon Sovereignty Bet