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Part 3 of this 4-part series analyzes methods and tools involved in debugging software at different layers of the software stack.
Software debugging involves identifying and resolving issues ranging from functional misbehaviors to crashes. The essential requirement for validating software programs is the ability to monitor… Read More
Functional coverage acts as a guide to direct verification resources by identifying the tested and untested portions of a design. Functional coverage is a user-defined metric that assesses the extent to which the design specification, as listed by the test plan’s features, has been used. It can be used to estimate the presence… Read More
Synopsys made significant announcements during the recent TSMC OIP Ecosystem Forum, showcasing a range of cutting-edge solutions designed to address the growing complexities in semiconductor design. With a strong emphasis on enabling next-generation chip architectures, Synopsys introduced both new technologies and … Read More
In semiconductor design there has been much fascination around the idea of using large language models (LLMs) for RTL generation; CoPilot provides one example. Based on a Google Scholar scan, a little over 100 papers were published in 2023, jumping to 310 papers in 2024. This is not surprising. If it works, automating design creation… Read More
The complexity of System-on-Chip (SoC) designs continues to rise at an accelerated rate, with design complexity doubling approximately every two years. This increasing complexity makes verification a more difficult and time-consuming task for design engineers. Among the key verification challenges is managing reset domain… Read More
Part 2 of this 4-part series reviews the role of virtual prototypes as stand-alone tools and their use in hybrid emulation for early software validation, a practice known as the “shift-left” methodology. It assesses the differences among these approaches, focusing on their pros and cons.
The Immensity of Software Development… Read More
How do you measure safety for a DNN? There is no obvious way to screen for a subset of safety-critical nodes in the systolic array at the heart of DNNs. Paul Cunningham (GM, Verification at Cadence), Raúl Camposano (Silicon Catalyst, entrepreneur, former Synopsys CTO and now Silvaco CTO) and I continue our series on research ideas.… Read More
As the demand for higher performance computing solutions grows, so does the need for faster, more efficient data communication between components in complex multi-die system-on-chip (SoC) designs. In response to these needs, Synopsys has introduced the world’s fastest UCIe-based IP solution, capable of operating at a groundbreaking… Read More
Data center density continues growing, driving interconnect technology to meet new challenges. Two of the largest are signal integrity and power consumption. Optical interconnects can solve many signal integrity issues posed by copper cabling and offer support for higher frequencies and bandwidths. Still, through sheer… Read More
Back in the 1970s we did Layout Versus Schematic (LVS) checks manually, so when internal EDA tools arrived in the 1980s it was a huge time saver to use LVS in finding the differences between layout and schematics. One premise before running LVS is that both layout and schematics are complete and ready for comparisons. Fast forward… Read More
Musk’s Orbital Compute Vision: TERAFAB and the End of the Terrestrial Data Center