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Transceiver Verification of a 20nm Altera FPGA Device

Transceiver Verification of a 20nm Altera FPGA Device
by Daniel Payne on 09-11-2014 at 6:00 pm

FPGA devices are a great way to drive silicon technology development because they contain both digital and analog IP, along with sophisticated IO cells. The highest performance IOs are transceivers, and Altera has recently designed the Arria 10 device family to include up to 96 transceivers, using a 20nm technology that can achieve… Read More


Smart Collaborative Design Reduces Business Risk

Smart Collaborative Design Reduces Business Risk
by Pawan Fangaria on 09-10-2014 at 4:00 pm

The semiconductor design industry is ever challenged with increasing chip density, manufacturing complexity with cutting-edge technologies, accommodating multiple IPs with different functionalities from various sources, optimizing power, performance and cost, maximizing manufacturability and reliability and still… Read More


A Comprehensive Power Analysis Solution for SoC+Package

A Comprehensive Power Analysis Solution for SoC+Package
by Pawan Fangaria on 09-08-2014 at 4:00 pm

Since power has become a critical factor in semiconductor chip design, the stress is towards decreasing supply voltage to reduce power consumption. However, the threshold voltage to switch devices cannot go down beyond a certain limit and these results in an extremely narrow margin for noise between the two. And that gets further… Read More


Design & EDA Collaboration Advances Mixed-Signal Verification through VCS AMS

Design & EDA Collaboration Advances Mixed-Signal Verification through VCS AMS
by Pawan Fangaria on 09-07-2014 at 8:00 pm

Last week it was a rare opportunity for me to attend a webinar where an SoC design house, a leading IP provider and a leading EDA tool provider joined together to present on how the tool capabilities are being used for advanced mixed-signal simulation of large designs, faster with accuracy. It’s always been a struggle to combine design… Read More


EDA Plus ARM Equals Big Views!

EDA Plus ARM Equals Big Views!
by Daniel Nenni on 09-07-2014 at 9:00 am

In looking at the SemiWiki analytics, one of the top search terms that brings traffic to our site is ARM, just about anything ARM. In fact, that’s what the next SemiWiki book will be about. Yes, ARM is that interesting. While EDA is also one of our top search terms, EDA+ARM will get the most views, absolutely. And let’s face it, bloggers… Read More


SmartScan Addresses Test Challenges of SoCs

SmartScan Addresses Test Challenges of SoCs
by Pawan Fangaria on 09-04-2014 at 4:00 pm

With advancement of semiconductor technologies, ever increasing sizes of SoCs bank on higher densities of design rather than giving any leeway towards increasing chip area and package sizes; a phenomenon often overlooked. The result is – larger designs with lesser number of pins bonded out of ever shrinking package sizes;… Read More


Synopsys VC VIP for Memory

Synopsys VC VIP for Memory
by Paul McLellan on 09-04-2014 at 7:01 am

Synopsys have been gradually broadening their portfolio of verification IP (VIP). It is 100% native SystemVerilog with native debug using Verdi (that was acquired from SpringSoft last year, now fully integrated into Verification Compiler). It has native performance with VCS. Going forward there are source code test suites.… Read More


Managing Stress in 3D

Managing Stress in 3D
by Beth Martin on 09-02-2014 at 1:32 pm

A new publication on mechanical stress in integrated circuits, co-edited by Valeriy Sukharev, Principal Engineer for Calibre R&D at Mentor Graphics, has just been released by AIP Publishing. “Stress-Induced Phenomena and Reliability in 3D Microelectronics” includes 14 key papers from four international workshops … Read More


Design Collaboration across Multiple Sites

Design Collaboration across Multiple Sites
by Pawan Fangaria on 09-02-2014 at 12:00 pm

Any SoC or IC design project, whether implemented at the same design site or multiple sites requires some data management tools to manage things such as a central data repository, revision management of files, etc., for effective co-ordination of work among different team members. Given the challenge of meeting the shrinking… Read More


How to detect weak nodes in a power-off analog circuit?

How to detect weak nodes in a power-off analog circuit?
by Jean-Francois Debroux on 09-01-2014 at 4:00 pm

Most analog cells have a power off mode intended to reduce power consumption. In this mode, all the circuit branches between the supply lines are set in a high impedance mode by driving MOS gates to a blocking voltage. This is a somewhat similar situation to that in tri-state digital circuits.

When a branch is set in that high impedance… Read More