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The Rise, Fall, and Rebirth of In-Circuit Emulation: Real-World Case Studies (Part 2 of 2)

The Rise, Fall, and Rebirth of In-Circuit Emulation: Real-World Case Studies (Part 2 of 2)
by Lauro Rizzatti on 10-20-2025 at 6:00 am

The Rise, Fall, and Rebirth of In Circuit Emulation real world case studies figure 1

Recently, I had the opportunity to speak with Synopsys’ distinguished experts in speed adapters and in-circuit emulation (ICE). Many who know my professional background see me as an advocate for virtual, transactor-based emulation, hence I was genuinely surprised to discover the impressive results achieved by today’s speed… Read More


Webinar – IP Design Considerations for Real-Time Edge AI Systems

Webinar – IP Design Considerations for Real-Time Edge AI Systems
by Mike Gianfagna on 10-16-2025 at 10:00 am

Webinar – IP Design Considerations for Real Time Edge AI Systems

It is well-known that semiconductor growth is driven by AI. That simple statement breaks down into many complex use cases, each with its own requirements and challenges. A webinar will be presented by Synopsys on October 23 that focuses on the specific requirements for one of the most popular use cases – AI at the edge. The speaker… Read More


WEBINAR: Design and Stability Analysis of GaN Power Amplifiers using Advanced Simulation Tools

WEBINAR: Design and Stability Analysis of GaN Power Amplifiers using Advanced Simulation Tools
by Daniel Nenni on 10-16-2025 at 6:00 am

figure1

Why should high frequency circuit designers consider stability early in the design process? Isn’t there enough to worry about just making the circuit function at the fundamental frequency?

In the past, Microwave Engineers used to solve stability problems in the lab, perhaps adding bypassing or loss in a strategic location to… Read More


Visualizing hidden parasitic effects in advanced IC design 

Visualizing hidden parasitic effects in advanced IC design 
by Admin on 10-15-2025 at 10:00 am

[white paper] Parasitic Analysis Figures

By Omar Elabd

As semiconductor designs move below 7 nm, parasitic effects—resistance, capacitance and inductance—become major threats to IC performance and reliability, often hiding where netlist reviews cannot reach. Design teams need advanced visualization tools like heat maps, layer-based analysis and direct layout… Read More


Statically Verifying RTL Connectivity with Synopsys

Statically Verifying RTL Connectivity with Synopsys
by Bernard Murphy on 10-15-2025 at 6:00 am

TestMAX Advisor Use Model min

Many years ago, not long after we first launched SpyGlass, I was looking around for new areas where we could apply static verification methods and was fortunate to meet Ralph Marlett, a guy (now friend) with extensive experience in DFT. Ralph joined us and went on to build the very capable SpyGlass DFT app. So capable that SpyGlass… Read More


Assertion IP (AIP) for Improved Design Verification

Assertion IP (AIP) for Improved Design Verification
by Daniel Payne on 10-14-2025 at 10:00 am

Detailed flow min

Over the years design reuse methodology created a market for Semiconductor IP (SIP), now with formal techniques there’s a need for Assertion IP (AIP). Where each AIP is a reusable and configurable verification component used in hardware design to detect protocol and functional violations in a Design Under Test (DUT).  LUBIS … Read More


Why Choose PCIe 5.0 for Power, Performance and Bandwidth at the Edge?

Why Choose PCIe 5.0 for Power, Performance and Bandwidth at the Edge?
by Kalar Rajendiran on 10-14-2025 at 6:00 am

PCIe 5.0 Impact Across Markets

Synopsys recently held a webinar session on this topic and Gustavo Pimentel, Principal Product Marketing Manager at the company led the webinar session. Going into the webinar session, I found myself wondering: why focus on PCIe 5.0, eight years after its release? With the industry buzzing about Edge AI, cloud computing, and … Read More


Protect against ESD by ensuring latch-up guard rings

Protect against ESD by ensuring latch-up guard rings
by Admin on 10-13-2025 at 10:00 am

fig1 latchup event

By Mark Tawfik

Overview: Protecting ICs from costly ESD and latch-up failures

Electrostatic discharge (ESD) events cost the semiconductor industry an estimated $8 billion annually in lost productivity, warranty claims and product failures [1].

Ensuring the robust protection of integrated circuits (ICs) against various… Read More


Podcast EP310: On Overview of the Upcoming DVCon Europe Conference and Exhibition with Dr. Mark Burton

Podcast EP310: On Overview of the Upcoming DVCon Europe Conference and Exhibition with Dr. Mark Burton
by Daniel Nenni on 10-10-2025 at 10:00 am

Daniel is joined by Dr. Mark Burton, the General Chair for this year’s DVCon Europe. DVCon is the premier conference on the application of languages, tools, and methodologies for the design and verification of electronic systems and integrated circuits.

Mark shares his long history of involvement in DVCon with Dan. He … Read More


Exploring TSMC’s OIP Ecosystem Benefits

Exploring TSMC’s OIP Ecosystem Benefits
by Daniel Nenni on 10-10-2025 at 6:00 am

TSMC Booth

Now that the dust has settled let’s talk more about TSMC’s Open Innovation Platform. Launched in 2008, OIP represents a groundbreaking collaborative model in the semiconductor industry. Unlike IDMs that controlled the entire supply chain, OIP fosters an “open horizontal” ecosystem uniting TSMC… Read More