Yield Analysis is a Critical Driver for Profitability

Yield Analysis is a Critical Driver for Profitability
by Daniel Nenni on 09-20-2017 at 7:00 am

One of the most important aspects of any manufacturing effort is the yield of the process. Today, the investment in facilities, equipment and materials is so high that consistently high yields are vital to the profitability of the semiconductor manufacturer. Furthermore, the engineers must get to that consistent high yield … Read More


Mentor Seminar: Evolution of diagnosis-driven yield analysis

Mentor Seminar: Evolution of diagnosis-driven yield analysis
by Beth Martin on 10-08-2013 at 1:20 pm

It’s a fact that new process nodes come with some amount of yield challenges. One way to find and eliminate silicon defects is through diagnosis-driven yield analysis (DDYA), which is the topic of a free seminar by Mentor Graphics in Fremont this Thursday, October 10 from 11:30am – 2pm (yes, lunch is included because Mentor… Read More


Mentor Graphics’ Best User2User Ever

Mentor Graphics’ Best User2User Ever
by Beth Martin on 04-23-2013 at 5:45 pm

Calling all Mentor users! Don’t forget to register for the U2U in San Jose on Thursday, April 25.

In addition to three worthy keynotes, you will find a more interactive and solution-focused day than in the past. There are sessions on place & route, custom/AMS, emulation, test and yield analysis, functional verification, Calibre… Read More


IC Test Sessions at SEMICON West 2012

IC Test Sessions at SEMICON West 2012
by Beth Martin on 07-02-2012 at 1:43 pm

SEMICON West is coming up this July 10-12 at the Moscone Center in San Francisco. It covers a broad swath of the microelectronics supply chain, but I was particularly interested in the test sessions. Here are two that I recommend.

The Value of Test for Semiconductor Yield Learning” on Tuesday, July 10, at 1:30p. The… Read More