Hierarchy is nearly universally used in the SoC design process to help manage complexity. Dealing with flat logical or physical designs proved unworkable decades ago. However, there were a few places in the flow where flat tools continued to be used. Mentor lead the pack in the years around 1999 in helping the industry move from … Read More
The 50th International Test Conference was just held in Washington DC, where papers, sessions, workshops and announcements addressing the increasing complexity and expanding use of semiconductors showed that innovations in test are crucial to design and product success. Test methodologies and even the scope of test have … Read More
It’s easy to imagine that the main impetus for automotive electronics safety standards like ISO 26262 is the emergence of autonomous driving technology. However, even cars that do not offer this capability rely heavily on electronics for many critical systems. These include engine control, braking, crash sensors, and stability… Read More
In conjunction with the 2018 International Test Conference, Mentor has several interesting test announcements. They also have a busy round of technical activities, including a number of technical papers, presentations, tutorials and a poster from a major customer about using Mentor. I’d like to touch on the two product related… Read More
Semiconductor companies are looking for ways to keep their business profitable by managing expenses on both the design and test side of electronic products, which is quite the challenge as the trends show increases in test pattern count and therefore test costs. Scan compression is a well-known technique first created over 15… Read More
The electronics market for automotive applications is distinguished by multiple factors. This is a very fast growing market – electronics now account for 40% of a car’s cost, up from 20% just 10 years ago. New technologies are gaining acceptance, for greener and safer operation and for a more satisfying consumer experience. Platforms… Read More
For decades, digital test has been fully automated including methodologies and automation for test pattern generation, grading and test time compression. Automation for analog and mixed-signal (AMS) IC test has not however kept pace. This is troubling as according to IBSapproximately 85% of SoC design starts are now AMS designs.… Read More
It requires lateral thinking in bringing new innovation into conventional solutions to age-old hard problems. While the core logic design has evolved adding multiple functionalities onto a chip, now called SoC, the structural composition of DFT (Design for Testability) has remained more or less same based on XOR-based compression… Read More
It is an indictment of our irrationality that our cars are now more health-conscious than we are. Increasingly safety-conscious readings of the ISO26262 standard now encourage that safety-critical electronics (anti-lock braking control for example) automatically self-test, not just at power-on but repeatedly as the car… Read More
Design sizes and complexities have grown exponentially (it’s a Law!), and consequentially the task of silicon test has become proportionally more expensive. The cost of testing a device is proportional to the amount of test data that is applied, and therefore the time it takes, which in turn is proportional to both design size … Read More
