ARTS23: IEEE Automotive Reliability, Test and Safety

ARTS23: IEEE Automotive Reliability, Test and Safety
by Admin on 09-15-2023 at 12:45 pm

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The ARTS workshop focuses exclusively on test, reliability, and safety of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under

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Webinar: Digitizing Test and Evaluation with DME

Webinar: Digitizing Test and Evaluation with DME
by Admin on 08-30-2023 at 2:24 pm

This webinar demonstrates solutions to support all aspects of aircraft test and evaluation efforts. This webinar includes reviewing and determining where tests are needed, how to plan tests to maximize test point density, real-time test support to recover missed test points, and faster analysis.

This is part 6 of a 7-part series

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International Test Conference (ITC) 2023

International Test Conference (ITC) 2023
by Admin on 08-21-2023 at 1:18 pm

About ITC

International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, testRead More


55th Test and Evaluation Working Group and Expo (TEWG)

55th Test and Evaluation Working Group and Expo (TEWG)
by Admin on 07-31-2023 at 3:33 pm

Test and Evaluation Working Group and Expo

The Operational Performance Evaluation Division (OPED) is hosting their annual Test and Evaluation Working Group (TEWG) and Expo on August 15-17, 2023 at the National Reconnaissance Office. This is a collaborative forum between NRO and IC supporting communities. The objective is

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International Test Conference – India, 2023

International Test Conference – India, 2023
by Admin on 04-03-2023 at 4:07 pm

About Us

International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis,

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Full-Stack, AI-driven EDA Suite for Chipmakers

Full-Stack, AI-driven EDA Suite for Chipmakers
by Kalar Rajendiran on 04-03-2023 at 6:00 am

Synopsys.ai Industry First AI driven Full EDA Suite

Semiconductor technology is among the most complex of technologies and the semiconductor industry is among the most demanding of industries. Yet the ecosystem has delivered incredible advances over the last six decades from which the world has benefitted tremendously. Yes, of course, the markets want that break-neck speed… Read More