Analog Characterization Environment (ACE)

Analog Characterization Environment (ACE)
by Daniel Nenni on 09-12-2013 at 10:00 am

I’m looking forward to the 2013 TSMC Open Innovation Platform Ecosystem Forum to be held Oct. 1[SUP]st[/SUP] in San Jose. One paper in particular that has my attention is titled, “An Efficient and Accurate Sign-Off Simulation Methodology for High-Performance CMOS Image Sensors,” by Berkeley Design Automation & … Read More


GPU-Based SPICE Simulator for Library Characterization

GPU-Based SPICE Simulator for Library Characterization
by Daniel Payne on 06-13-2013 at 11:55 am

Jeff Tuanis the CEO and President of an EDA startup called G-Analog, founded in May 2012. His background includes working at: Cadence, Epic, Synopsys, Nassda, Chartered Semi and GLOBALFOUNDRIES. Jason Lu is the R&D manager. We met at DAC last week to talk about his company’s new product called Gchar for IC library characterization… Read More


NanGate Launches Aggressive DAC Campaign: 50 Library Characterization Licenses for USD 50K

NanGate Launches Aggressive DAC Campaign: 50 Library Characterization Licenses for USD 50K
by Daniel Nenni on 05-30-2013 at 12:00 pm

NanGate today announced a very aggressive “50-50 campaign”. Throughout June and July and in celebration of DAC 50th anniversary, NanGate will be offering 50 licenses of its Library Characterizer™ product for USD 50K for the first year. The offer applies to new customers as well as to existing customers that do not yet license the… Read More


TSMC ♥ Berkeley Design Automation

TSMC ♥ Berkeley Design Automation
by Daniel Nenni on 05-30-2013 at 11:00 am

As I mentioned in BDA Takes on FinFET Based Memories with AFS Mega:

Is AFS Mega real? Of course it is, I’m an SRAM guy and I worked with BDA on this product so I know. But don’t take my word for it, stay tuned for endorsements from the top SRAM suppliers around the world.

Here is the first customer endorsement from the #1 foundry.… Read More


BDA Introduces High-Productivity Analog Characterization Environment (ACE)

BDA Introduces High-Productivity Analog Characterization Environment (ACE)
by Daniel Nenni on 05-19-2013 at 7:45 pm

Last week Berkeley Design Automation introduced a new Analog Characterization Environment (ACE) – a high-productivity system to ensure analog circuits meet all specifications under all expected operational, environmental, and process conditions prior to tapeout.

While standard cell characterization and memory characterization… Read More


An AMS Seminar on May 16th

An AMS Seminar on May 16th
by Daniel Payne on 05-02-2013 at 8:05 pm

Analog and Mixed-Signal (AMS) designers are facing more challenges than ever, so where can they go to get some relief? One place is a half-day seminar scheduled for May 16th in Bridgewater, New Jersey. SemiWiki has teamed up with Tanner EDA, Abbot Labs and SoftMEMS to present topics of:

  • True collaborative design enabled through
Read More

Hot Topic – CMOS Image Sensor Verification!

Hot Topic – CMOS Image Sensor Verification!
by Daniel Nenni on 04-29-2013 at 7:30 pm

Mobile applications require CMOS image sensor devices that have a low signal-to-noise ratio (SNR), low power, small area, high resolution, high dynamic range, and high frame rate. CMOS image sensor imaging performance is noise limited requiring accurate noise analysis on the pixel array electronics and column readout circuitry.… Read More