Chiplet is a hot topic in the semiconductor world these days. So much so that if one hasn’t heard that term, the person must be living on a very isolated islet. Humor aside, products built using chiplets-based methodology have been in existence for at least some years now. Companies such as Intel, AMD, Apple and others have integrated… Read More
Tag: Siemens EDA
Tessent SSN Enables Significant Test Time Savings for SoC ATPG
SoC test challenges arise due to the complexity and diversity of the functional blocks integrated into the chip. As SoCs become more complex, it becomes increasingly difficult to access all of the functional blocks within the chip for testing. SoCs also can contain billions of transistors, making it extremely time-consuming… Read More
Webinar: From variant management to integrated electrical planning in mechanical and plant engineering
Optimally combine electrical planning and mechanical variant management.
May 24, 2023 at 02:00 AM PDT
Learn how to merge your electrical planning and your mechanical variant management.
Electrical planning is usually organized independently of mechanical product data in other environments and data pools. This makes configuration
Achieving Optimal PPA at Placement and Carrying it Through to Signoff
Performance, Power and Area (PPA) metrics are the driving force in the semiconductor market and impact all electronic products that are developed. PPA tradeoff decisions are not engineering decisions, but rather business decisions made by product companies as they decide to enter target end markets. As such, the sooner a company… Read More
Mitigating the Effects of DFE Error Propagation on High-Speed SerDes Links
As digital transmission speeds increase, designers use various techniques to improve the signal-to-noise ratio at the receiver output. One such technique is the Decision Feedback Equalizer (DFE) scheme, commonly used in high-speed Serializer-Deserializer (SerDes) circuits to mitigate the effects of channel noise and … Read More
DVCon: Sponsored Workshop: A Methodology for Power and Energy Efficient Systems Design
Power is everywhere. Traditionally, power used to be a concern with mobile and handheld devices due to battery life considerations. But now, power as a concern is prevalent in all verticals of the industry, for example, data centers consume huge amounts of power due to million of data transactions happening per second. Processors… Read More
Building better design flows with tool Open APIs – Calibre RealTime integration shows the way forward
You don’t often hear about the inner workings of EDA tools and flows – the marketing guys much prefer telling us about all the exciting things their tools can do rather than the internal plumbing. But this matters for making design flows – and building these has largely been left to the users to sort out. That’s an increasing challenge… Read More
Calibre: Early Design LVS and ERC Checking gets Interesting
The last thing you want when taping out a design is to hit large numbers of violations in signoff checks that could have been flushed out and resolved in earlier flow iterations. For implementation flows (floorplanning, synthesis, place and route), it’s usual to do a lot of flow flushing work early in the design cycle and iteratively… Read More
Pushing Acceleration to the Edge
As more AI applications turn to edge computing to reduce latencies, the need for more computational performance at the edge continues to increase. However, commodity compute engines don’t have enough compute power or are too power-hungry to meet the needs of edge systems. Thus, when designing AI accelerators for the edge, Joe… Read More
Intel Foundry Services Forms Alliance to Enable National Security, Government Applications
This will be the year of the semiconductor foundry ecosystem, absolutely. Right in between the Samsung SAFE Forum and the TSMC OIP Open Ecosystem Forum, Intel Foundry Services (IFS) just announced a United States Military, Aerospace, and Government (USMAG) Alliance.
Brilliant move, of course, due to the US Government now being… Read More