I’ve blogged about the Calibre family of IC design tools before:
Smart Fill replaced Dummy Fill Approach in a DFM Flow
DRC Wiki
Graphical DRC vs Text-based DRC
Getting Real time Calibre DRC Results with Custom IC Editing
Transistor-level Electrical Rule Checking
Who Needs a 3D Field Solver for IC Design?
Prevention is Better… Read More
The outlook for the global semiconductor market in 2011 has deteriorated from earlier in the year due to multiple factors including slower than expected economic growth in the U.S., debt crises in Europe and the Japan earthquake and tsunami. Recent forecasts have narrowed down to a range of -1.4% to 3.5%. In the first half of 2011,… Read More
The Nintendo Wii is one of the most successful gaming platforms with the most diverse set of games — from fun games that can be enjoyed by the whole family to fitness programs that can be used by adults. They beat the dominant Sony Playstation and the Microsoft Xbox by thinking outside the box and creating a platform that was really… Read More
3D-IC design has become a popular discussion topic in the past few years because of the integration benefits and potential cost savings, so I wanted to learn more about how the DRC and LVS flows were being adapted. My first stop was the Global Semiconductor Alliance web site where I found a presentation about how DRC and LVS flows were… Read More
I just put up a blog about the EDA interoperability forum, much of which is focused on standards. Which reminded me just how long-lived some standards turn out to be.
Back in the late 1970s Calma shipped workstations (actually re-badged Data General minicomputers) with a graphic display. That was how layout was done. It’s… Read More
The 24th Interoperability Forum is coming up at the end of the month on November 30th to be held at the Synopsys compus in Mountain View. It lasts from 9am until lunch (and yes, Virginia, there is such a thing as a free lunch). I think it looks like a very interesting way to spend a morning.
Here are the speakers and what they are speaking… Read More
One of the challenges of doing a design in the 28nm world is that everything depends on everything else. But some decisions need to be made early with imperfect information. But the better the information we have, the better those early decisions will be. One area of particular importance is selecting a package, designing a power… Read More
The goal for automatic test pattern generation (ATPG) is to achieve maximum coverage with the fewest test patterns. This conflicts with the goals of managing power because during test, the IC is often operated beyond its normal functional modes to get the highest quality test results. When switching activity exceeds a device’s… Read More
Hello Daniel,
I am very interested on the articles on the PVT simulation, I have worked in that area in the past when I worked in process technology development and spice modeling and I also started a company called Device modeling technology (DMT) which built a Spice model library of discrete components, such as Bipolar/MOS /POWER… Read More
Wow! We always hear semiconductor companies complain about the lack of innovation amongst the EDA leaders. Placing high on the Deloitte 500 list shows that innovation is alive and well in EDA and it IS possible to have a meaningful impact regardless of your overall size. It is worth noting that there are very few EDA companies that… Read More
