Lowering your PCB Costs through Panelization

Lowering your PCB Costs through Panelization
by Admin on 11-17-2020 at 6:34 am

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Online – Dec 9, 2020
11:00 AM – 12:00 PM US/Eastern
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Overview

One area that can save significant cost that many designers and managers don’t consider is designing your own PCB panels. You can learn from an expert how to get more efficient use out of the available

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Embedded Software Debug Using Integrated Codelink and Visualizer HW/SW Debug Environment

Embedded Software Debug Using Integrated Codelink and Visualizer HW/SW Debug Environment
by Admin on 11-17-2020 at 6:29 am

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Online – Dec 8, 2020
8:00 AM – 9:00 AM US/Pacific
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Overview

Intuitive and easy to use, Codelink Software Debug Environment automates debugging for embedded software and correlates embedded software and hardware debug of complex SoC’s.

During debug, Visualizer

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MEMS Digital Qualification – Predicting Yield During Initial Design

MEMS Digital Qualification – Predicting Yield During Initial Design
by Admin on 11-17-2020 at 6:28 am

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Online – Dec 3, 2020
9:00 AM – 10:00 AM US/Pacific
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Online – Dec 3, 2020
5:00 PM – 6:00 PM US/Pacific
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Overview

In MEMS and semiconductor design, 20% of the upstream design decisions affect 80% of the downstream foundry

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Secure Mobility Vitals: Transport Layer Security (TLS) and Firewall

Secure Mobility Vitals: Transport Layer Security (TLS) and Firewall
by Admin on 11-17-2020 at 6:27 am

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Online – Nov 24, 2020
14:00 – 15:00 Europe/London
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Overview

This presentation will cover remote access requirements of connected vehicles, an internet-based threat analysis and design considerations for TLS and firewall. Practical examples from in-production

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Visualizer Coverage: Debug and Visualize All Your Coverage Without Leaving Your House – Even If You Can

Visualizer Coverage: Debug and Visualize All Your Coverage Without Leaving Your House – Even If You Can
by Admin on 11-17-2020 at 6:24 am

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Online – Nov 19, 2020
8:00 AM – 9:00 AM US/Pacific
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Overview

Trying to figure out how to achieve 100% coverage closure?

Wondering how to view coverage, find issues and fix them all at one place?

Visualizer Debug Environment gives the user many ways to analyze

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Mentor Offers Next Generation DFT with Streaming Scan Network

Mentor Offers Next Generation DFT with Streaming Scan Network
by Tom Simon on 11-12-2020 at 10:00 am

Streaming Scan Network

Design for test (DFT) requires a lot of up-front planning that can be difficult to alter if testing needs or performance differ from initial expectations. Hierarchical methodologies help in many ways including making it easier to reduce on chip resources such as the number of test signals. Also, hierarchical test allows for speed-ups… Read More


2020 Wilson Research Group Verification Survey Results

2020 Wilson Research Group Verification Survey Results
by Admin on 10-07-2020 at 3:24 pm

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Online – Oct 13, 2020
8:00 AM – 9:00 AM US/Pacific

Overview

The 2019 global semiconductor market was valued at $385.4 billion after experiencing a 15% decline due to a 32% drop in the memory IC market, which is expected to recover in 2021. The IC/ASIC portion of the semiconductor

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How About a Faster Fast SPICE? Much Faster!

How About a Faster Fast SPICE? Much Faster!
by Tom Simon on 07-22-2020 at 10:35 am

Analog FastSPICE eXTreme

When Analog FastSPICE was first introduced in 2006 it changed the landscape for high performance SPICE simulation. During the last 14 years it has been used widely to verify advanced nanometer designs. Of course, since then the most advanced designs have progressed significantly, making verification even more difficult. Just… Read More


The Moving Target Known as UPF

The Moving Target Known as UPF
by Tom Simon on 06-18-2020 at 10:00 am

UPF hierarchy

As if engineers did not have enough difficulty just getting everything right so that their designs are implemented functionally correct, the demands of lowering power consumption require changes that can affect functionality and verification. Techniques such as power gating, clock gating, mixed supply voltage, voltage … Read More