IR drop analysis across your board, package and SoC ensures that your Power Delivery Network (PDN) is robust, and that your system will function to spec. There are both static and dynamic approaches to IR drop analysis of a full-chip with billions of transistors, while the dynamic approach produces the most accurate results compared… Read More
John Pierce, Cadence
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Linda Fosler, Mentor Graphics… Read More
Mentor Graphics throws a very nice dinner party at DAC each year for journalists, bloggers and top customers, so this year I spoke with Michael Buehler-Garcia about what’s new with Calibre.
Michael Buehler-Garcia, Mentor Graphics
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Debugging an IC design at the transistor, Gate and RTL levels is often necessary to meet timing requirements and understand analog or digital behavior, yet the process itself can be a tedious one, filled with manual steps, therefore making it an error-prone process. EDA tools have been created to help us graphically debug transistor,… Read More
There’s never a dull moment in the foundry race to offer FinFET processes that enable leading-edge SoC design. Today I attended a webinar hosted by Samsung and Synopsys on how to enable 14nm FinFET design. The two speakers were Dr. Kuang-Kuo Lin from Samsung and Dr. Henry Sheng from Synopsys.
Dr. Kuang-Kuo Lin, Samsung
Dr.… Read More
Two weeks ago I blogged about analog verification and it started a discussion with 16 comments, so l’ve found that our readers have an interest in this topic. For decades now the Digital IC design community has used and benefited from regression testing as a way to measure both design quality and progress, ensuring that first… Read More
One of the most useful ways to learn about an EDA tool is to talk with other users that have experience with that tool. IC Place and Route tools are complex and yet necessary to implement every SoC designed today, so at DAC in just two weeks you have a chance to hear first-hand from several P&R tool users. To get a better idea about these… Read More