Easy-Logic and Functional ECOs at #61DAC

Easy-Logic and Functional ECOs at #61DAC
by Daniel Payne on 08-01-2024 at 10:00 am

gtech min

I first visited Easy-Logic at DAC in 2023, so it was time to meet them again at #61DAC in San Francisco to find out what’s new this year. Steven Chen, VP Sales for North America and Asia met with me in their booth for an update briefing. Steven has been with Easy-Logic for six years now and earned an MBA from Baruch College in New York. This… Read More


Webinar: Accelerate time to success using smart methods for DFT chip architecture and validation

Webinar: Accelerate time to success using smart methods for DFT chip architecture and validation
by Admin on 04-22-2024 at 1:26 pm

Combining market-leading design-for-test (DFT) technologies with best-in-class netlist synthesis allows you to achieve DFT success more quickly. Many customers, including those for emulation and IC test, have challenges with scaling architectures. This webinar describes how Siemens emulation and silicon test solutions

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Upskill Your Smart Soldiers and Conquer the Chip War in Style!

Upskill Your Smart Soldiers and Conquer the Chip War in Style!
by Sivakumar PR on 07-21-2023 at 6:00 am

Maven Silicon Article Figure 1

My recent article, ‘Chip War without Soldiers’ explained the importance of upskilling and preparing the chip design workforce in this current scenario, and it also explained how it will lead to ‘Fabs without Chips’ if we don’t prioritize it. VLSI Engineers are the pillars of the semiconductor industry, and they can only transform… Read More


DFT Moves up to 2.5D and 3D IC

DFT Moves up to 2.5D and 3D IC
by Daniel Payne on 10-06-2022 at 10:00 am

2.5D and 3D chiplets min

The annual ITC event was held the last week of September, and I kept reading all of the news highlights from the EDA vendors, as the time spent on the tester can be a major cost and the value to catching defective chips from reaching production is so critical. Chiplets, 2.5D and 3D IC design have caught the attention of the test world, … Read More


CEO Interview: Sivakumar P R of Maven Silicon

CEO Interview: Sivakumar P R of Maven Silicon
by Daniel Nenni on 06-25-2021 at 6:00 am

CEO Profile Photo

Sivakumar P R is the Founder and CEO of Maven Silicon. He is responsible for the company’s vision, overall strategy, business, and technology. He is also the Founder and CEO of Aceic Design Technologies.

Sivakumar is a seasoned engineering professional who has worked in various fields, including electrical engineering,… Read More


Smarter Product Lifecycle Management for Semiconductors

Smarter Product Lifecycle Management for Semiconductors
by Tom Simon on 03-24-2021 at 10:00 am

Lifecycle Management for Silicon

Product Lifecycle Management (PLM) for electronic systems has moved from a passive ‘fire and forget’ approach to one that is intimately involved not only during design, but also throughout the entire life of every unit delivered to the field. Siemens EDA has a white paper titled “Tessent Silicon Lifecycle Solutions” that talks… Read More


Observation Scan Solves ISO 26262 In-System Test Issues

Observation Scan Solves ISO 26262 In-System Test Issues
by Tom Simon on 03-23-2021 at 10:00 am

Observation scan for ISO 26262

Automotive electronic content has been growing at an accelerating pace, along with a shift from infotainment toward mission critical functions such as traction control, safety systems, engine control, autonomous driving, etc. The ISO 26262 automotive electronics safety standard evolved to help ensure that these systems… Read More


Mentor Offers Next Generation DFT with Streaming Scan Network

Mentor Offers Next Generation DFT with Streaming Scan Network
by Tom Simon on 11-12-2020 at 10:00 am

Streaming Scan Network

Design for test (DFT) requires a lot of up-front planning that can be difficult to alter if testing needs or performance differ from initial expectations. Hierarchical methodologies help in many ways including making it easier to reduce on chip resources such as the number of test signals. Also, hierarchical test allows for speed-ups… Read More


Power in Test at RTL Defacto Shows the Way

Power in Test at RTL Defacto Shows the Way
by Bernard Murphy on 10-15-2020 at 6:00 am

scan chains crossing power domainspng

In the early days of Atrenta I met with Ralph Marlett, a distinguished test expert with many years of experience at Zuken and Recal Redac. He talked me into believing we could do meaningful static analysis for DFT-friendliness at RTL. His work with us really opened my eyes to the challenges that test groups face in integrating their… Read More


Getting Physical to Improve Test – White Paper

Getting Physical to Improve Test – White Paper
by Tom Simon on 08-26-2020 at 6:00 am

Calculating Total Critical Area

One of the most significant and oft repeated trends in EDA is the use of information from layout to help drive other parts of the design flow. This has happened with simulation and synthesis among other things. Of course, we think of test as a physical operation, but test pattern generation and sorting have been netlist based operations.… Read More