Bridging Design Environments for Advanced Multi-Die Package Verification

Bridging Design Environments for Advanced Multi-Die Package Verification
by Tom Dillinger on 03-28-2016 at 12:00 pm

This year is shaping up to be an inflection point, when multi-die packaging technology will experience tremendous market growth. Advanced 2.5D/3D package offerings have been available for several years, utilizing a variety of technologies to serve as the package substrate, interposer material for embedding die micro-bump… Read More


Calibre in the Middle of Semiconductor Ecosystem

Calibre in the Middle of Semiconductor Ecosystem
by Pawan Fangaria on 12-20-2015 at 12:00 pm

Albert Einsteinhad said, “In the middle of difficulty lies opportunity”. In today’s world dominated by technology, or I must say internet which has initiated collaborative information sharing, “leading from the middle” is the new mantra of life.… Read More


For high-volume manufacturing at 10 nm and below: technology and friendship

For high-volume manufacturing at 10 nm and below: technology and friendship
by Beth Martin on 09-03-2015 at 4:00 pm

The technology for 10 nm is settled, but what about 7 nm and 5 nm? Those nodes will happen with silicon-based CMOS and 193nm immersion lithography, but exactly how is still being worked out. Right now, though, the focus is on getting 10 nm chips into high-volume production. TSMC and Intel both claim to be on track for high-volume manufacturing… Read More


Boost the Market for Interposer and 3D ICs with Assembly Design Kits

Boost the Market for Interposer and 3D ICs with Assembly Design Kits
by Beth Martin on 07-29-2015 at 6:00 pm

The traditional system-on-chip (SoC) design process has fully qualified verification methods embodied in the form of process design kits (PDKs). Why is it that chip design companies and assembly houses have no IC/package co-design sign-off verification process?

Package die are often produced using multiple processes and… Read More


Automate those voltage-dependent DRC checks!

Automate those voltage-dependent DRC checks!
by Beth Martin on 06-04-2015 at 10:00 pm

Because IC design and verification never gets simpler, verification engineers now have to comply with voltage-dependent DRC (VD-DRC) rules. What does this term mean, and what new challenges does it bring to the DRC task? I’d like to share what I learned during another water-cooler conversation with Dina Medhat, senior technical… Read More


Will those IO pad rings pass foundry muster?

Will those IO pad rings pass foundry muster?
by Beth Martin on 05-31-2015 at 10:00 pm

I was talking recently to Dina Medhat, a senior technical marketing engineer at Mentor, about, of all things, IO rings. It has not occurred to me that verifying that your IO rings comply with foundry rules presents new challenges.

IO ring checking isn’t new, nor is it unique to advanced IC process nodes. However, the same forces of… Read More


Experts Talk at Mentor Booth

Experts Talk at Mentor Booth
by Pawan Fangaria on 05-11-2015 at 7:00 pm

It’s less than four weeks to go at DAC 2015 and the program is final now. So I started investigating new technologies, trends, methodologies, and tools that will be unveiled and discussed in this DAC. In the hindsight of the semiconductor industry over the last year, I see 14nm technologies in the realization stage and 10nm beckoning… Read More


Calibre xACT Shakes Up 16nm and Below Extraction Game

Calibre xACT Shakes Up 16nm and Below Extraction Game
by Tom Simon on 05-09-2015 at 8:00 am

Mentor Graphics made a big announcement regarding SOC extraction at their User2User conference in San Jose during April. Before I get to the meat of the announcement, I’d like to reflect back on the early days of Calibre-DRC at Mentor. I was in Sales at Mentor around 1999, and Calibre-DRC was the new kid on the block. We had to go convince… Read More


Lake Tahoe: The Center of ESD Innovation

Lake Tahoe: The Center of ESD Innovation
by glforte on 03-15-2015 at 1:00 pm

Almost anyone that is active in IC design will be “in touch” with Electrostatic Discharge (ESD) at some time (pun intended). Preventing ESD related IC failures remains something like black magic—at least it’s easy to get that feeling when you are trying to debug ESD failures. I/O and ESD layouts that resulted in excellent robustness… Read More


Mentor 2014 Results

Mentor 2014 Results
by Paul McLellan on 02-27-2015 at 7:25 pm

Yesterday Mentor announced their quarterly results. Since their financial year is not aligned with the calendar year, this was also the end of their fiscal 2015. The quarter was an all-time record with revenues of $439M and (non-GAAP) EPS of $1.09. The year was also an all-time record with revenues of $1.24B and EPS of $1.77. Half… Read More