An earlier post on SemiWiki discussed how deep data analytics helps accelerate SoC product development. The post presented insights into proteanTecs’ technology and quantified the benefits that can be derived by leveraging the software platform for SoC product development. You can review that earlier blog here. The power … Read More
Tag: bist
Smarter Product Lifecycle Management for Semiconductors
Product Lifecycle Management (PLM) for electronic systems has moved from a passive ‘fire and forget’ approach to one that is intimately involved not only during design, but also throughout the entire life of every unit delivered to the field. Siemens EDA has a white paper titled “Tessent Silicon Lifecycle Solutions” that talks… Read More
DFT Innovations Come from Customer Partnerships
There is an adage that says that quality is not something that can be slapped on at the end of the design or manufacturing process. Ensuring quality requires careful thought throughout development and production. Arguably this adage is more applicable to the topic of Design for Test (DFT) than almost any other area of IC development… Read More
Synopsys – Turbocharging the TCAM Portfolio with eSilicon
About 90 days ago, Synopsys completed the acquisition of certain IP assets from eSilicon. The remaining entirety of eSilicon was acquired by Inphi Corporation. I was the VP of marketing at eSilicon during that acquisition so it’s very interesting to me to find out how things are going with those certain IP assets. I got an opportunity… Read More
Automotive Market Pushing Test Tool Capabilities
It’s easy to imagine that the main impetus for automotive electronics safety standards like ISO 26262 is the emergence of autonomous driving technology. However, even cars that do not offer this capability rely heavily on electronics for many critical systems. These include engine control, braking, crash sensors, and stability… Read More
In-System Automotive Test
I’ve been driving cars since 1975 and in the early days we had simplistic gauges for feedback like: Speed, Fuel level, Oil level, RPM. Back then when you popped the hood of a car you could see through the engine compartment onto the ground below, however with today’s cars the engine compartments are crammed with tubes,… Read More
Reducing the Cost of SoC Testing
Every year certain technology themes appear, like at ITC this year a big theme was how to reduce the cost of SoC testing. I spoke with Rob Knoth of Cadence by phone to hear more about this cost of test theme. Rob gave me an example of an SoC that takes 27 seconds on a tester, so at $0.04 per second in test costs amounts to $1.08 per part. If you… Read More
Cadence Adds New Dimension to SoC Test Solution
It requires lateral thinking in bringing new innovation into conventional solutions to age-old hard problems. While the core logic design has evolved adding multiple functionalities onto a chip, now called SoC, the structural composition of DFT (Design for Testability) has remained more or less same based on XOR-based compression… Read More
What’s Testing Design Limits at ITC?
The 46[SUP]th[/SUP] IEEE International Test Conference (ITC) will be held the week of October 5, 2015 at the Disneyland Hotel Conference Center in Anaheim, California. ITC is where you will discover the latest ideas and learn about practical applications of test technologies.
As you take in panels, tutorials, presentations,… Read More
SoCs in New Context Look beyond PPA – Part2
In the first part of this article, I talked about some of the key business aspects along with some technical aspects like system performance, functionality, and IP integration that drive the architecture of an SoC for its best optimization and realization in an economic sense. In this part, let’s dive into some more aspects that… Read More