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Moortec SemiWiki Banner 800 x 100
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Hyper-Scaling Of Data Centers – Environmental Impact Of The Carbon ‘Cloud’

Hyper-Scaling Of Data Centers – Environmental Impact Of The Carbon ‘Cloud’
by Stephen Crosher on 03-19-2020 at 10:00 am

Stephen Crosher Moortec CEO Square High Res

It is predicted that by 2030 energy consumption attributable to data centers will make up a staggering 8% of the world’s total usage!

As we move in to 2020 it’s clear that every sector of industry, including the semiconductor industry, will have a responsibility to address growing environmental concerns. We should be aware that… Read More


Talking Sense With Moortec – The Future Of Embedded Monitoring Part 2

Talking Sense With Moortec – The Future Of Embedded Monitoring Part 2
by Stephen Crosher on 02-28-2020 at 10:00 am

Stephen Crosher Moortec CEO Square High Res

The rate of product development is facing very real challenges as the pace of silicon technology evolution begins to slow. Today, we are squeezing the most out of transistor physics, which is essentially derived from 60-year-old CMOS technology. To maintain the pace of Moore’s law, it is predicted that in 2030 we will need transistors… Read More


The Future Of Embedded Monitoring – February 2020

The Future Of Embedded Monitoring – February 2020
by Stephen Crosher on 02-14-2020 at 10:00 am

Stephen Crosher SemiWiki

Shall I compare thee to a…Rolls Royce jet engine?

‘There is a new era dawning whereby deeply embedded sensing within all technology will bring about great benefit for the reliability and performance of semiconductor-based products.’  These were my words during a presentation to an industry audience in China back in SeptemberRead More


Making AI Silicon Smart with PVT Monitoring

Making AI Silicon Smart with PVT Monitoring
by Tom Simon on 11-26-2018 at 7:00 am

PVT – depending on what field you are in those three letters may mean totally different things. In my undergraduate field of study, chemistry, PVT meant Pressure, Volume & Temperature. Many of you probably remember PV=nRT, the dreaded ideal gas law. However, anybody working in semiconductors knows that PVT stands … Read More


A Smart Way for Chips to Deal with PVT Issues

A Smart Way for Chips to Deal with PVT Issues
by Tom Simon on 10-30-2018 at 7:00 am

We have all become so used to ‘smart’ things that perhaps in a way we have forgotten what it was like before many of the things we use day to day had sensors and microprocessors to help them respond to their environment. Cars are an excellent example. It used to be commonplace to run down your battery by leaving your lights on. Now cars … Read More


Improving Yield and Reliability with In-Chip Monitoring, there’s an IP for that

Improving Yield and Reliability with In-Chip Monitoring, there’s an IP for that
by Daniel Payne on 08-24-2018 at 12:00 pm

There’s an old maxim that you can only improve what you measure, so quality experts have been talking about this concept for decades and our semiconductor industry has been the recipient of such practices to such an extent that we can now buy consumer products that include chips with over 5 billion transistors in them. You’ve… Read More


Optimization and Reliability for FinFET designs at #55DAC

Optimization and Reliability for FinFET designs at #55DAC
by Daniel Payne on 07-25-2018 at 7:00 am

TSMC is the leading foundry worldwide and they make a big splash each year at the DAC exhibit and conference, so I stopped by their theatre area during the presentation from IP vendor Moortec to see what’s new this year. Stephen Crosher was the presenter from Moortec and we had exchanged emails before, so this was the first time… Read More


Self-Monitoring SoCs – An Idea Coming of Age

Self-Monitoring SoCs – An Idea Coming of Age
by Mitch Heins on 12-15-2017 at 12:00 pm

In a former life I was the GM of a business where we built specialized structures used for semiconductor process bring-up, characterization and monitoring. These monitoring structures were placed in wafer scribe-lines and were used to monitor key parameters during wafer processing. The structures provided feedback to automated… Read More