In my last article I talked about the physical design aspect of 3D-IC. Now looking at its verification aspect, it spans through a wide spectrum of test at hardware as well as software level. The verification challenge goes much beyond that of a SoC which is at a single plane. Even a typical SoC that comprises of a processor core, memory… Read More
Double Patterning and Then The End of Lithography
I went to a couple more sessions at the Common Platform Technology Forum today, on 20nm double patterning and whatever will we do at 14nm. Basically, this is the end of planar transistors and the end of optical lithography. One session was by IBM scientists about process and one by Michael White of Mentor about double patterning. … Read More
Common Platform Technology Forum: Peering into the Future
Next Wednesday is the Common Platform Technology Forum. “Common Platform” is a name that only a committee could have come up with, giving no clue as to what it actually is. As you probably know, there are various process clubs sharing the costs of technology development (TD) and one of them consists of IBM, Samsung and… Read More
Seminar on IC Yield Optimization at DATE on March 14th
My first chip design at Intel was a DRAM and we had a 5% yield problem caused by electromigration issues, yes, you can have EM issues even with 6um NMOS technology. We had lots of questions but precious few answers on how to pinpoint and eliminate the source of yield loss. Fortunately, with the next generation of DRAM quickly introduced… Read More
DFM Provides Proven Value
Although design for manufacturing (DFM) tools and techniques have been around for several nodes, a lot of designers remain skeptical about their actual value, especially since many products still make it successfully to market without the use of DFM.… Read More
DFM Industry Survey
As part of the DFM Conference at the SPIE Advance Lithography symposium, the DFM committee is conducting an informal survey on the current state of Design For Manufacturability in the Semiconductor Industry.
Please take this anonymous 16 question survey to identify critical Design for Manufacturability (DFM) issues facing… Read More
DFM at SPIE Advance Litho show
This year’s SPIE Advanced Lithography is loaded with interesting keynotes and sessions. To help me narrow down what to see, I spoke with John Sturtevant. John is co-chair of the Design for Manufacturability through Design-Process Integration conference, and the director for technical marketing for RET products at Mentor Graphics.… Read More
Design & Verification of Platform-Based, Multi-Core SoCs
Consumer electronics is a new driver in our global semiconductor economy as we enjoy using Smart Phones, Tablets and Ultra Books. The challenge of designing and then verifying the electronic systems to meet the market windows is a daunting one. Instead of starting with a blank sheet for a new product, most electronic design companies… Read More
The Future of Lithography Process Models
Always in motion is the future. ~Yoda
For nearly ten years now, full-chip simulation engines have successfully used process models to perform OPC in production. New full-chip models were regularly introduced as patterning processes evolved to span immersion exposure, bilayer resists, phase shift masking, pixelated illumination… Read More
SemiWiki and Mentor Graphics Seminar Series!
For the greater good of the semiconductor ecosystem, SemiWiki and Mentor Graphics present SemiWiki Seminars, a free seminar and software demonstration series addressing the latest innovations in IC design. SemiWiki Seminars discuss interesting new challenges and potential solutions aimed at increased circuit density … Read More