Through my contacts at SemiWiki I was introduced to a mixed signal IP company named SilabTech, and then decided to interview the founder and CEO, Sujoy Chakravarty.
Sujoy Chakravarty, CEO and Founder
… Read More
AMS IC Design at SilabTech
Increasing Automotive Semiconductor Test Quality
The growing amount of electronics within today’s automobiles is driving very high quality and reliability requirements to a widening range of semiconductor devices. At the same time, traditional fault models are becoming less effective at achieving desired silicon quality levels. Improvements in test solutions are needed… Read More
Hardware Assisted Verification
On the Tuesday of DAC I moderated a panel session on Hardware Assisted Verification in 10 Years: More Need, More Speed. Although this topic obviously could include FPGA-based prototyping, in fact we spent pretty much the whole time talking about emulation. Gary Smith, on Sunday night, actually set up things by pointing out that… Read More
DAC: Wally’s Vision
One new feature at DAC this year is that several of the keynotes are preceded by a ten minute vision of the future from one of the EDA CEOs. Today it was Wally Rhines’s turn. Wally is CEO of Mentor Graphics. He titled his talk Changing the World Through EDA. Since EDA as we know it started in the late 1970s, the number of transistors… Read More
Robust Reliability Verification: Beyond Traditional Tools and Techniques
Robust Reliability Verification: Beyond Traditional Tools
by Matthew Hogan, Mentor Graphics
At all process nodes, countless hours are diligently expended to ensure that our integrated circuit (IC) designs will function in the way we intended, can be manufactured with satisfactory yields, and are delivered in a timely fashion… Read More
DAC lunch seminar: Better IP Test with IEEE P1687
What: DAC lunch seminar (register here)
When: June 5, 2013, 11:30am – 1:30pm
Where: At DAC in lovely Austin, TX
Dr. Martin Keim of Mentor Graphics will present this overview of the new the IEEE P1687 standard, called IJTAG for ‘internal’ JTAG.
If you are involved in IC test*, you’ve probably heard about IJTAG. If you … Read More
Bats about DAC!
DAC 2013 is closing in fast now…and if you haven’t made your plans for what you want to see and do, you’d better get going! Of course, I’m happy to help you out with a few suggestions…starting with that most important objective—conference swag. Stop by the Mentor Graphics booth (#2046, for those of you who actually look at your floor… Read More
IC Place and Route Perspective from Users at DAC
One of the most useful ways to learn about an EDA tool is to talk with other users that have experience with that tool. IC Place and Route tools are complex and yet necessary to implement every SoC designed today, so at DAC in just two weeks you have a chance to hear first-hand from several P&R tool users. To get a better idea about these… Read More
Cell-Aware Test Seminar
You may have heard about cell-aware testing. It’s a transistor-level test (ATPG) methodology that is quickly becoming a hot topic. If you are involved in DFT and are looking for better quality and reliability, you should definitely know about cell-aware testing.
And lucky you, on May 16, 2013, you can attend a free seminar on cell-aware… Read More
Mentor CEO Wally Rhines U2U Keynote
You will never meet a more approachable CEO in the semiconductor ecosystem than Dr. Walden C. Rhines. The first time I met Wally was way back when I blogged for food and he invited me over for lunch. Even better, a year or two later I was having dinner with a friend at the DBL Tree in San Jose. Wally was waiting for his flight home so he joined… Read More