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A Fill Solution for 20nm at TSMC

A Fill Solution for 20nm at TSMC
by glforte on 03-17-2014 at 5:12 pm

By Jeff Wilson, Mentor Graphics

We’ve talked about the new requirements for Fill in IC design for advanced nodes in previous blogs on this site. This time I’d like describe the fill solution that Mentor and TSMC have jointly developed to meet the requirements of fill for TSMC’s 20nm (N20) manufacturing process.

The traditional… Read More


Dr. Walden Rhines Vision on Semiconductor & India

Dr. Walden Rhines Vision on Semiconductor & India
by Pawan Fangaria on 03-04-2014 at 11:00 am

Last month India Electronics & Semiconductor Association (IESA) held its Vision Summit at Bangalore in which luminaries from across the semiconductor and electronics industry presented their views about the future of this industry and India’s progress. Dr. Walden C. Rhines, Chairman and CEO of Mentor Graphicspresented… Read More


One SPIE session not to miss

One SPIE session not to miss
by Beth Martin on 02-19-2014 at 4:19 pm

The time is nigh for another meeting of the practitioners of the lithographic arts, dark and otherwise, at the SPIE Advanced Lithography symposium.

I love this conference for the engagement you see, both in the sessions and in the hallways. People actually meet and talk and argue. There’s always interesting gossip, exciting technologies,… Read More


Verification of Power Delivery Networks

Verification of Power Delivery Networks
by Paul McLellan on 02-18-2014 at 2:43 pm

Power delivery networks (PDN) are the metal structures on a chip that delivers the power. In a high-end desktop SoC this might be delivering as much as 150W, and with voltages around 1V that means over 150 amps of current. Clearly getting the PDN correct is critical for a correctly functioning chip. One of the challenges to verifying… Read More


Smart Strategies for Efficient Testing of 3D-ICs

Smart Strategies for Efficient Testing of 3D-ICs
by Pawan Fangaria on 02-12-2014 at 6:30 am

3D-IC has a stack of dies connected and packaged together, and therefore needs new testing strategies other than testing a single die. It’s given that a single defective die can render the whole of 3D-IC unusable, so each die in the stack must be completely and perfectly tested before its entry into that stack. Looking at it from a … Read More


Verification Execution: When will we get it right?

Verification Execution: When will we get it right?
by Daniel Payne on 02-06-2014 at 7:50 pm

Verification technologist Hemendra Talesaraattended a conference in Austin and asked me to post this article on verification execution for him as a blog. I first met Hemendra when he worked at XtremeEDA, and now he works at Synapse Design Automation – a design services company.
“In theory there is no difference between … Read More


Verification Execution: When will we get it right?

Verification Execution: When will we get it right?
by Daniel Payne on 02-06-2014 at 7:50 pm

Verification technologist Hemendra Talesaraattended a conference in Austin and asked me to post this article on verification execution for him as a blog. I first met Hemendra when he worked at XtremeEDA, and now he works at Synapse Design Automation – a design services company.
“In theory there is no difference between … Read More


TSMC OIP presentations available!

TSMC OIP presentations available!
by Beth Martin on 01-27-2014 at 6:27 pm

Are you a TSMC customer or partner? If so, you’ll want to take a look at these presentations from the 2013 TSMC Open Innovation Platform conference:

Read More

Stop TDDB from getting through peanut butter

Stop TDDB from getting through peanut butter
by Don Dingee on 01-24-2014 at 6:00 pm

There are a few dozen causes of semiconductor failure. Most can be lumped into one of three categories: material defects, process or workmanship issues, or environmental or operational overstress. Even when all those causes are carefully mitigated, one factor is limiting reliability more as geometries shrink – and it… Read More


Managing Heat for System Reliability

Managing Heat for System Reliability
by Pawan Fangaria on 01-17-2014 at 8:30 am

In most of the electronic equipments, semiconductor chips are a major source of heat generation. And in semiconductor designs several hardware and software techniques are being used to contain power dissipation; a major cause for heat. However due to multiple functionality being squeezed into small form factors, we continue… Read More