When Ethernet was introduced in 1983 it ran at 10Mbps and mostly relied on hubs and coaxial cable. Twelve years later a faster speed was introduced, running at 100Mbps. Since then we have seen an acceleration of new data rate introductions. According top the Ethernet Alliance, Ethernet could have 12 speeds before 2020, with 6 of … Read More
Price of Admission $0.00 at Inaugural Silicon Valley Conference
Back in 2002, the Southwest DFT Conference was born and experts on design for test (DFT) and test got together to share ideas and talk to people in this industry that were trying to solve test challenges of the day.… Read More
IoT chipsets and enterprise emulation tools
When most people talk about the IoT, it is usually all about wearables-this and low-power-that – because everyone is chasing the next huge consumer post-mobile device market. Mobile devices have provided the model. The smartphone is the on-ramp to the IoT for most consumers, with Bluetooth, Wi-Fi, and LTE, and maybe a dozen or … Read More
Meeting DFM Challenges with Hierarchical Fill Data Insertion
To describe the latest methodology for the addition of Design for Manufacturability fill shapes to design layout data, it’s appropriate to borrow a song title from Bob Dylan – The Times They Are A Changin’. The new technical requirements are best summarized as: “The goal is now to add as much fill as possible, which (ideally) looks… Read More
Something Old, Something New…EDA and Verification
When I got the opportunity to blog about verification, I thought, what new and interesting things should I talk about? Having started my EDA career in 1983, I often feel like one of the “oldies” in this business…remember when a hard drive required a static strap, held a whopping 33 MB, and was the size of a brick? Perhaps they should … Read More
What’s Testing Design Limits at ITC?
The 46[SUP]th[/SUP] IEEE International Test Conference (ITC) will be held the week of October 5, 2015 at the Disneyland Hotel Conference Center in Anaheim, California. ITC is where you will discover the latest ideas and learn about practical applications of test technologies.
As you take in panels, tutorials, presentations,… Read More
Top 10 Reasons to invest in Interactive Design Rule Checking tools
One of the most energetic presentations at the recent TSMC OIP 2015 symposium was given by Tom Williams from Qualcomm, who shared his insights (and enthusiasm!) for Mentor’s Calibre RealTime interactive Design Rule Checking (iDRC) product.
Paraphrasing Tom’s presentation (and with a tip of the hat to David Letterman), here … Read More
Together At Last—Combining Netlist and Layout Data for Power-Aware Verification
The market demanded that gadgets it loves become ever more conscious of their power consumption, and chip designers responded with an array of clever techniques to cut IC power use. Unsurprisingly, these new techniques added to the complexity of IC verification. When you’re verifying a design that has 100+ separate power domains,… Read More
IoT does NOT lack tools!
Rarely does a month go by without acquisitions in the fabless semiconductor ecosystem. Not surprisingly one of the most read pages on SemiWiki is the EDA Merger and Acquisitions Wiki with more than fifty seven thousand views. It really is a nice family tree, one which we (Daniel Payne) are diligent on keeping current. One of the most… Read More
Moving up Verification to Scenario Driven Methodology
Verification complexity and volume has always been on the rise, taking significant amount of time, human, and compute resources. There are multiple techniques such as simulation, emulation, FPGA prototyping, formal verification, post-silicon testing, and so on which gain prominence in different situations and at different… Read More