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Much of the technology that goes into aerospace applications is some of the most advanced technology that exists. However, these same systems must also offer the highest level of reliability in what is arguably an extremely difficult environment. For semiconductors a major environmental risk in aerospace applications are … Read More
The development of the Unified Power Format (UPF) was spurred on by the need for explicit ways to enable specification and verification of power management aspects of SoC designs. The origins of UPF date back to its first release in 2007. Prior to that several vendors had their own methods of specifying power management aspects … Read More
With ever challenging time to market requirements, co-developing IP and firmware is imperative for all system development projects. But that doesn’t make the task any easier. Depending on the complexity of the system being developed, the task gets tougher. For example, different pieces of IP may be the output of various teams… Read More
Typically, there is an existential rift between the on-chip access requirements for test and the need for security in SoCs. Using traditional deterministic scan techniques has meant opening up full read and write access to the flops in a design through the scan chains. Having this kind of access easily defeats the best designed… Read More
Harry Foster opened and wrapped a tutorial at DVCon 2022 on “The Best Verification Strategy You’ve Never Heard Of”. Harry started with a common refrain on verification; we face a crisis thanks to a combination of growing complexity in the systems we are able to design, yet double exponential growth in verification cost for… Read More
Lauro Rizzatti recently interviewed Andy Meier, product manager in the Scalable Verification Solutions Division at Siemens EDA. Andy is a product manager in the Scalable Verification Solutions Division at Siemens EDA. Andy has held positions in the electronics and high-tech fields during his 20-year career including: Sr.… Read More
The success of modern battery-powered products depends as much on useful operating time between charges as on functionality. FinFET process technologies overtook earlier planar CMOS in part because they significantly reduce leakage power. But they exacerbate dynamic power consumption thanks to increased pin capacitances.… Read More
I’ve been following Neil Johnson on Twitter and LinkedIn for several years now, as he has written and shared so much about the IC design and verification process, both as a consultant and working at EDA vendors. His recent white paper for Siemens EDA caught my eye, so I took the time to read through the 10 page document to learn… Read More
Multi-chip modules are now more important than ever, even though the basic concept has been around for decades. With The effects of Moore’s Law and other factors such as yield, power, and process choices, reasons for dividing what once would have been a single SOC into multiple die and integrating them in a single module have become… Read More
The old phrase that the cure is worse than the disease is apropos when discussing MBIST for large SOCs where running many MBIST tests in parallel can exceed power distribution network (PDN) capabilities. Memory Built-In Self-Test (MBIST) usually runs automatically during power on events. Due to the desire to speed up test and … Read More
Podcast EP170: An Overview of the New Calibre Shift-Left Methodology with Jeff Wilson
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[Node] => XF\Entity\Node Object
(
[_uniqueEntityId:XF\Mvc\Entity\Entity:private] => 48
[rootClass:protected] => XF\Entity\Node
[_useReplaceInto:protected] =>
[_newValues:protected] => Array
(
)
[_values:protected] => Array
(
[node_id] => 367
[title] => Siemens EDA
[description] =>
[node_name] =>
[node_type_id] => Forum
[parent_node_id] => 355
[display_order] => 380
[display_in_list] => 1
[lft] => 97
[rgt] => 98
[depth] => 2
[style_id] => 0
[effective_style_id] => 4
[breadcrumb_data] => {"385":{"node_id":385,"title":"Companies","depth":0,"lft":13,"node_name":null,"node_type_id":"LinkForum","display_in_list":true},"355":{"node_id":355,"title":"Company Forums","depth":1,"lft":14,"node_name":null,"node_type_id":"Category","display_in_list":true}}
[navigation_id] =>
[effective_navigation_id] =>
)
[_relations:protected] => Array
(
)
[_previousValues:protected] => Array
(
)
[_options:protected] => Array
(
)
[_deleted:protected] =>
[_readOnly:protected] =>
[_writePending:protected] =>
[_writeRunning:protected] =>
[_errors:protected] => Array
(
)
[_whenSaveable:protected] => Array
(
)
[_cascadeSave:protected] => Array
(
)
[_behaviors:protected] =>
)
)
[_previousValues:protected] => Array
(
)
[_options:protected] => Array
(
)
[_deleted:protected] =>
[_readOnly:protected] =>
[_writePending:protected] =>
[_writeRunning:protected] =>
[_errors:protected] => Array
(
)
[_whenSaveable:protected] => Array
(
)
[_cascadeSave:protected] => Array
(
)
[_behaviors:protected] =>
)
)
[_previousValues:protected] => Array
(
)
[_options:protected] => Array
(
)
[_deleted:protected] =>
[_readOnly:protected] =>
[_writePending:protected] =>
[_writeRunning:protected] =>
[_errors:protected] => Array
(
)
[_whenSaveable:protected] => Array
(
)
[_cascadeSave:protected] => Array
(
)
[_behaviors:protected] =>
)
)
[populated:protected] => 1
)