100X800 Banner (1)
WP_Term Object
(
    [term_id] => 157
    [name] => EDA
    [slug] => eda
    [term_group] => 0
    [term_taxonomy_id] => 157
    [taxonomy] => category
    [description] => Electronic Design Automation
    [parent] => 0
    [count] => 4359
    [filter] => raw
    [cat_ID] => 157
    [category_count] => 4359
    [category_description] => Electronic Design Automation
    [cat_name] => EDA
    [category_nicename] => eda
    [category_parent] => 0
    [is_post] => 
)

AMS Experts Share IC Design Stories at #55DAC

AMS Experts Share IC Design Stories at #55DAC
by Daniel Payne on 08-01-2018 at 7:00 am

At #55DAC in SFO the first day is always the busiest on the exhibit floor, so Monday by lunch time I was hungry and took a short walk to the Marriott hotel nearby to listen to AMS experts from several companies talk about their EDA tool use, hosted by Synopsys:

  • Samsung
  • Toshiba Memory Corp.
  • NVIDIA
  • Seagate
  • Numem
  • Esperanto
Read More

Verification Importance in Academia

Verification Importance in Academia
by Alex Tan on 07-31-2018 at 12:00 pm

“Testing can only prove the presence of bugs, not their absence,” stated the famous computer scientist Edsger Dijkstra. That notion rings true to the many college participants of the Hack@DAC competition offered during DAC 2018 in San Francisco. The goal of this competition is to develop tools and methods for identifying security… Read More


Webinar: Differential Energy Analysis for Improved Performance/Watt in Mobile GPU

Webinar: Differential Energy Analysis for Improved Performance/Watt in Mobile GPU
by Bernard Murphy on 07-31-2018 at 7:00 am

May want to listen up; Qualcomm are going to be sharing how they do this. There is a constant battle in designing for low power; you don’t accurately know what the power consumption is going to be until you build it, but by the time you’ve built it, it’s too late to change the design. So you have to find methods to estimate power early on,… Read More


Machine Learning Meets Scan Diagnosis for Improved Yield Analysis

Machine Learning Meets Scan Diagnosis for Improved Yield Analysis
by Tom Simon on 07-30-2018 at 12:00 pm

Naturally, chips that fail test are a curse, however with the advent of Scan Logic Diagnosis these failures can become a blessing in disguise. Through this technique information gleaned from multiple tester runs can help pin down the locations of defects. Initially tools that did Scan Logic Diagnosis relied on the netlist to filter… Read More


Daniel’s #55DAC Trip Report

Daniel’s #55DAC Trip Report
by Daniel Payne on 07-29-2018 at 7:00 am

Another year, another DAC, and last month it was #55DAC in SFO and the first thing that I noticed was that the event was no longer located in the traditional North or South Halls, rather we were in the smaller, Moscone West on two floors, almost like a 3D FinFET. Checkin to get my badge was highly automated and oh so fast, well done.… Read More


1-on-1 with Anirudh Devgan, President, Cadence

1-on-1 with Anirudh Devgan, President, Cadence
by Tom Dillinger on 07-27-2018 at 12:00 pm

At the Design Automation Conference, no one is busier than an EDA company executive — conference panels, product launch briefings, customer meetings, and corporate dinners all place considerable demands on their time. I was fortunate enough to be able to meet with Anirudh Devgan, President of Cadence, at the recent DAC55 in San… Read More


Low Cost Power NB-IoT Solution? Fusion F1 DSP based Modem!

Low Cost Power NB-IoT Solution? Fusion F1 DSP based Modem!
by Eric Esteve on 07-26-2018 at 12:00 pm

Supporting NB-IoT requires low cost (optimized silicon footprint) and ultra-low power solution to cope with IoT device requirement. Cadence Fusion F1 DSP IP has been integrated in modem IC by two new customers, Xinyi and Rafael, gaining traction in NB-IoT market. These design-win builds on previous momentum: software GPS solution… Read More


Cadence Selected to Support Major DARPA Program

Cadence Selected to Support Major DARPA Program
by Bernard Murphy on 07-26-2018 at 7:00 am

When DARPA plans programs, they’re known for going big – really big. Which is what they are doing again with their Electronics Resurgence Initiative (ERI). Abstracting from their intro, this is a program “to ensure far-reaching improvements in electronics performance well beyond the limits of traditional scaling”. This isn’t… Read More


Autonomous Driving and Functional Safety

Autonomous Driving and Functional Safety
by Tom Dillinger on 07-25-2018 at 12:00 pm

The timelines proposed by automobile manufacturers for enabling fully autonomous driving are extremely aggressive. At the recent DAC55 conference in San Francisco, I attended a panel discussion on Functional Safety issues for assisted and autonomous driving, sponsored by Mentor Graphics. I also had the opportunity to chat… Read More


Automotive is setting the goalposts for next generation designs

Automotive is setting the goalposts for next generation designs
by Tom Simon on 07-24-2018 at 12:00 pm

Automotive applications are having a tremendous influence on semiconductor design. This influence is coming from innovations in cloud computing, artificial intelligence, communications, sensors that all serve the requirements of the automotive market. It should come as no surprise that ADAS and autonomous driving are … Read More