As chip design complexity increases, integration scales expand and time-to-market pressures grow, as a result, design verification has become increasingly challenging. In multi-FPGA environments, the complexity of design debugging and verification further escalates, making it difficult for traditional debugging methods… Read More
Electronic Design Automation
Prioritize Short Isolation for Faster SoC Verification
Improve productivity by shifting left LVS
In modern semiconductor design, technology nodes continue to shrink and the complexity and size of circuits increase, making layout versus schematic (LVS) verification more challenging. One of the most critical errors designers encounter during LVS runs are shorted nets. Identifying… Read More
The Perils of Aging, From a Semiconductor Device Perspective
We‘re all aware of the challenges aging brings. I find the older I get, the more in touch I feel with those challenges. I still find it to be true that aging beats the alternative. I think most would agree. Human factors aside, I’d like to discuss the aging process as applied to the realm of semiconductor device physics. Here, as with… Read More
Navigating Resistance Extraction for the Unconventional Shapes of Modern IC Designs
The semiconductor industry is experiencing rapid evolution, driven by the proliferation of IoT applications, image sensors, photonics, MEMS applications, 3DIC and other emerging technologies. This growth has dramatically increased the complexity of integrated circuit (IC) design. One aspect of this complexity is the … Read More
Hearing Aids are Embracing Tech, and Cool
You could be forgiven for thinking of hearing aids as the low end of tech, targeted to a relatively small and elderly audience. Commercials seem unaware of advances in mobile consumer audio, and white-haired actors reinforce the intended audience. On the other hand, the World Health Organization has determined that at least 6%… Read More
CEO Interview: Tobias Ludwig of LUBIS EDA
Tobias began his journey with a strong academic foundation in electronic design automation, studying at a leading university in Germany that specialized in formal verification. After graduating, Tobias gained hands-on experience in the semiconductor industry, where he quickly recognized the challenges and inefficiencies… Read More
Webinar: When Failure in Silicon Is Not an Option
If the thought of a silicon respin keeps you awake at night, you’re not alone. Re-fabricating a chip can cost tens of millions of dollars. An unplanned respin also risks a delay in getting a product to market, which adds tremendous costs in terms of lost business.
Undoubtedly, adding to your sleep loss is the recent rise in respins.… Read More
Maximizing 3DIC Design Productivity with 3DBlox: A Look at TSMC’s Progress and Innovations in 2024
At the 2024 TSMC OIP Ecosystem Forum, one of the technical talks by TSMC focused on maximizing 3DIC design productivity and rightfully so. With rapid advancements in semiconductor technology, 3DICs have become the next frontier in improving chip performance, energy efficiency, and density. TSMC’s focus on streamlining the… Read More
The Immensity of Software Development and the Challenges of Debugging (Part 3 of 4)
Part 3 of this 4-part series analyzes methods and tools involved in debugging software at different layers of the software stack.
Software debugging involves identifying and resolving issues ranging from functional misbehaviors to crashes. The essential requirement for validating software programs is the ability to monitor… Read More
SystemVerilog Functional Coverage for Real Datatypes
Functional coverage acts as a guide to direct verification resources by identifying the tested and untested portions of a design. Functional coverage is a user-defined metric that assesses the extent to which the design specification, as listed by the test plan’s features, has been used. It can be used to estimate the presence… Read More
Reachability in Analog and AMS. Innovation in Verification