WP_Term Object
(
    [term_id] => 121
    [name] => IROC Technologies
    [slug] => iroc-technologies
    [term_group] => 0
    [term_taxonomy_id] => 121
    [taxonomy] => category
    [description] => 
    [parent] => 14433
    [count] => 13
    [filter] => raw
    [cat_ID] => 121
    [category_count] => 13
    [category_description] => 
    [cat_name] => IROC Technologies
    [category_nicename] => iroc-technologies
    [category_parent] => 14433
    [is_post] => 
)

Reliability is the New Power

Reliability is the New Power
by Paul McLellan on 03-09-2013 at 9:56 am

It has be come a cliche to say that “power is the new timing”, the thing that keeps designers up at night and drives the major architectural decisions in big SoCs. Nobody is saying it yet but perhaps “reliability is the new power” will be tomorrow’s received wisdom.

I talked to Adrian Evans of IROCTech… Read More


We Live on a Radioactive Planet

We Live on a Radioactive Planet
by Paul McLellan on 03-01-2013 at 1:45 pm

Often as we move down the process node treadmill, new challenges appear that we didn’t really have to worry about before. Often, these challenges require addressing at a number of different levels: the process, the cell libraries, the design, the EDA tools that we use.

One well known example is the problem of metal migration.… Read More


Soft Error Rate (SER) Prediction Software for IC Design

Soft Error Rate (SER) Prediction Software for IC Design
by Daniel Payne on 04-16-2012 at 10:00 am

My first IC design in 1978 was a 16Kb DRAM chip at Intel and our researchers discovered the strange failure of Soft Errors caused by Alpha particles in the packaging and neutron particles which are more prominent at higher altitudes like in Denver, Colorado. Before today if you wanted to know the Soft Error Rate (SER) you had to fabricate… Read More