IROC Technologies specializes in helping the semiconductor industry to evaluate and manage reliability risks throughout the chip design and manufacturing process. As deep submicron technology makes chips more vulnerable to component and system reliability issues, IROC provides analysis software, test services, and expert consultation to reduce risks and improve chip quality.
More than half of our executives have been working at IROC for at least 10 years, working toward a more reliable SoC with respect to radiation impacts. We work collaboratively to reach our intrinsic goal to meet the needs and satisfaction of our customers and stakeholders.
Best-in-class cell level soft error detector
TFIT® (Transistor Failure In Time) is a best-in-class transistor/cell level soft error simulator. Thanks to its unique approach and close collaboration with foundries, TFIT enables high-speed, accurate simulation of the radiation effects of standard cells and custom designs implemented in main process nodes available on the market.
The TFIT methodology is based on 3D TCAD characterization of each technology node for ionizing particles is used by TFIT to simulate radiation effects at the spice level, transforming heavy TCAD computational tasks into much faster ones.
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