IROC Technologies specializes in helping the semiconductor industry to evaluate and manage reliability risks throughout the chip design and manufacturing process. As deep submicron technology makes chips more vulnerable to component and system reliability issues, IROC provides analysis software, test services, and expert consultation to reduce risks and improve chip quality.
More than half of our executives have been working at IROC for at least 10 years, working toward a more reliable SoC with respect to radiation impacts. We work collaboratively to reach our intrinsic goal to meet the needs and satisfaction of our customers and stakeholders.
PRODUCTS
TFIT
Best-in-class cell level soft error detector
TFIT® (Transistor Failure In Time) is a best-in-class transistor/cell level soft error simulator. Thanks to its unique approach and close collaboration with foundries, TFIT enables high-speed, accurate simulation of the radiation effects of standard cells and custom designs implemented in main process nodes available on the market.
The TFIT methodology is based on 3D TCAD characterization of each technology node for ionizing particles is used by TFIT to simulate radiation effects at the spice level, transforming heavy TCAD computational tasks into much faster ones.
PRODUCTS
SoCFIT
Unique SoC level soft error analysis and mitigation
SoCFIT is a state-of-the-art EDA tool for reliability-focused design characterization of complex digital circuits. It enables digital designers to understand the propagation of faults in the circuit and their impact on the system. This allows them to assess the compliance of their solutions with set reliability targets and functional safety standards. With SoCFIT, designers can significantly reduce reliability constraints and minimize the cost of mitigating faults in terms of design effort, silicon area and power consumption.
SoCFIT is a complete SER analysis platform, which provides a comprehensive set of algorithms and solutions, applicable from circuit- to system-level. Depending on the design stage and the reliability expectations of the application, the trade-off between accuracy and effort can be adjusted to meet quality requirements without excessive costs from over-design.
In the context of functional safety analysis (such as ISO26262 for automotive applications), SoCFIT is able to estimate the number of safe faults that are not considered in the analysis.
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