Safeguard power domain compatibility by finding missing level shifters

Safeguard power domain compatibility by finding missing level shifters
by Admin on 05-14-2025 at 10:00 am

fig1 missing level shifters

In the realm of mixed signal design for integrated circuits (ICs), level shifters play a critical role for interfacing circuits that operate at different voltage levels. A level shifter converts signal from one voltage level to another, ensuring compatibility between components. Figure 1 illustrates a missing level shifter… Read More


Metal fill extraction: Breaking the speed-accuracy tradeoff

Metal fill extraction: Breaking the speed-accuracy tradeoff
by Admin on 05-12-2025 at 10:00 am

fig1 metal fill

As semiconductor technology scales and device complexity increases, accurately modeling the parasitic effects of metal fill has become critical for circuit performance, power integrity, and reliability. Metal fill is a crucial part of the manufacturing process, ensuring uniform layer density, improving planarization,… Read More


Speculative Execution: Rethinking the Approach to CPU Scheduling

Speculative Execution: Rethinking the Approach to CPU Scheduling
by Admin on 05-07-2025 at 6:00 am

IBM AI

By Dr. Thang Minh Tran, CEO/CTO Simplex Micro

In the world of modern computing, speculative execution has played a pivotal role in boosting performance by allowing processors to guess the outcomes of instructions ahead of time, keeping pipelines full and reducing idle cycles. Initially introduced during the development of … Read More


Keysom and Chipflow discuss the Future of RISC-V in Automotive: Progress, Challenges, and What’s Next

Keysom and Chipflow discuss the Future of RISC-V in Automotive: Progress, Challenges, and What’s Next
by Admin on 04-10-2025 at 6:00 am

image chipflow keysom

by, Tomi Rantakari CEO ChipFlow & Luca Testa COO Keysom

The automotive industry is undergoing a major transformation, driven by electrification, the rise of new market players, and the rapid adoption of emerging technologies such as AI. Among the most significant advancements is the growing adoption of RISC-V, an open-standard… Read More


Truechip at the 2024 Design Automation Conference

Truechip at the 2024 Design Automation Conference
by Admin on 06-17-2024 at 6:00 pm

DAC 2024 Banner

We are excited to announce that Truechip, a leading provider of Verification IP solutions, will be actively participating at DAC 2024, taking place from June 23-25 at Moscone West, San Francisco, CA. This event is a pivotal gathering for professionals in the verification industry, and Truechip’s presence will be a highlight … Read More


Mastering Atomic Precision – ALD’s Role in Semiconductor Advancements

Mastering Atomic Precision – ALD’s Role in Semiconductor Advancements
by Admin on 06-11-2024 at 8:00 am

Application Areas Photo (1)

Atomic layer deposition (ALD) is a thin-film deposition method that continues to enable continuous advances in semiconductor device fabrication. Essentially, it involves exposing substrates sequentially to at least two different vapor phase atmospheres in which self-limiting reactions take place on the surface: the first… Read More


The Case for U.S. CHIPS Act 2

The Case for U.S. CHIPS Act 2
by Admin on 06-03-2024 at 8:00 am

America CHIPs ACT

Despite murky goals and moving targets, the recent CHIPS Act sets the stage for long term government incentives.

Authored by Jo Levy and Kaden Chaung

On April 25, 2024, the U.S. Department of Commerce announced the fourth, and most likely final, grant under the current U.S. CHIPS Act for leading-edge semiconductor manufacturing.… Read More


Are you Aware about Risks Related to Soft Errors?

Are you Aware about Risks Related to Soft Errors?
by Admin on 07-10-2023 at 6:00 am

Image1

Soft errors change stored data and cause temporal malfunctions in electronic systems. This mainly occurs when radiation particles collide with semiconductor devices. Soft errors are a concern in all environments, whether in the atmosphere, in space, or on the ground.

Soft errors are critical in high-reliability applications… Read More