Silvaco was founded the same year I entered the EDA industry (1984) fresh from University. I first met them at the Design Automation Conference in Albuquerque, New Mexico, and have been an active observer of their growth ever since. In fact, Silvaco is now the largest privately held EDA company and is growing at a rapid pace. In 2014 Silvaco hired Dave Dutton as CEO bringing us Silvaco 2.0 and the rest is history in the making, absolutely.
Today, Silvaco delivers a full TCAD-to-Signoff flow for vertical markets including: displays, power electronics, optical devices, radiation & soft error reliability, analog and HSIO design, library and memory design, advanced CMOS process and IP development. It all begins with TCAD which brings us to the topic at hand today for their upcoming webinar:
The continuous scaling of semiconductor devices is a driving force in the field of microelectronics. However, this miniaturization goes hand in hand with various undesired degradation effects, which make a prediction of the MOS device operation less reliable. In particular, the Negative Bias Temperature Instability (NBTI) has attracted much industrial attention due to its severe impact on the device performance. In order to understand, predict, and reduce these degradation effects, TCAD simulations are of high importance.
This webinar will cover several of the most prominent reliability models (available in Silvaco’s TCAD tools). We will review their basic features and key parameters and discuss their correct calibration and comparison to experimental results.
What attendees will learn:
Capabilities of Silvaco’s TCAD solutions for reliability issues
Presentation of the most important models
Discussion of their basic features and key parameters
How to perform TCAD simulations
Correct setup of a reliability simulation
Correct comparison to the experimental data
Dr. Wolfgang Goes is a development engineer in Silvaco’s TCAD Division. Since joining Silvaco in 2016, he has worked primarily on Victory Device but also on Atlas and is responsible for trapping and reliability models. Dr. Goes holds an MSc in Technical Physics and a PhD in Electrical Engineering, both from the TU Vienna. He continued working there as a post-doc at the Institute for Microelectronics focusing on reliability issues in microelectronic devices.
Who should attend:
Academics, engineers, and management interested in investigations of degradation effects in semiconductor devices.
When: February 28, 2019
Time: 10:00am – 11:00am – (PST)
Silvaco, Inc. is a leading EDA provider of software tools used for process and device development and for analog/mixed-signal, power IC and memory design. The portfolio also includes tools for power integrity sign off, reduction of extracted netlist, variation analysis and also production-proven intellectual property (IP) cores. Silvaco delivers a full TCAD-to-Signoff flow for vertical markets including: displays, power electronics, optical devices, radiation & soft error reliability, analog and HSIO design, library and memory design, advanced CMOS process and IP development. The company is headquartered in Santa Clara, California, and has a global presence with offices located in North America, Europe, Japan and Asia. For over 30 years, Silvaco has enabled its customers to bring superior products to market in the shortest time with reduced cost. Semiconductor fabs and design houses from around the globe have relied on Silvaco’s expertise to help develop the “technology behind the chip”. Silvaco’s mission is to help our customers accelerate the pace of technological innovation and their time to market while reducing their costs in developing the next-generation chips. We strive to understand our customers’ challenges so as to tailor the innovative products, services and support they need to succeed in their technology development and productivity goals. www.silvaco.com