White Paper: A Closer Look at Aging on Clock Networks

White Paper: A Closer Look at Aging on Clock Networks
by Tom Simon on 01-02-2022 at 6:00 am

Transistor Aging

We all know that designers work hard to reach design closure on SOC designs. However, what gets less attention from consumers is the effort that goes into ensuring that these chips will be fully operational and meeting timing specs over their projected lifetime. Of course, this is less important for chips used in devices with projected… Read More


Methodology for Aging-Aware Static Timing Analysis

Methodology for Aging-Aware Static Timing Analysis
by Tom Dillinger on 12-28-2021 at 10:00 am

char STA flow

At the recent Design Automation Conference, Cadence presented their methodology for incorporating performance degradation measures due to device aging into a static timing analysis flow. [1] (The work was a collaborative project with Samsung Electronics.)  This article reviews the highlights of their presentation.

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Silvaco on Simulation of Reliability and NBTI Aging in MOS Microelectronics

Silvaco on Simulation of Reliability and NBTI Aging in MOS Microelectronics
by Daniel Nenni on 02-20-2019 at 12:00 pm

Silvaco was founded the same year I entered the EDA industry (1984) fresh from University. I first met them at the Design Automation Conference in Albuquerque, New Mexico, and have been an active observer of their growth ever since. In fact, Silvaco is now the largest privately held EDA company and is growing at a rapid pace. In 2014… Read More