Failure and Yield Analysis is an increasingly difficult and complex process. Today, engineers are required to locate defects on complex integrated circuits. In many ways, this is akin to locating a needle in a haystack, where the needles get smaller and the haystack gets bigger every year. Engineers are required to understand… Read More
Failure and Yield Analysis is an increasingly difficult and complex process. Today, engineers are required to locate defects on complex integrated circuits. In many ways, this is akin to locating a needle in a haystack, where the needles get smaller and the haystack gets bigger every year. Engineers are required to understand… Read More
Failure and Yield Analysis is an increasingly difficult and complex process. Today, engineers are required to locate defects on complex integrated circuits. In many ways, this is akin to locating a needle in a haystack, where the needles get smaller and the haystack gets bigger every year. Engineers are required to understand… Read More
If you search on “the six signs” you will find references to a fantasy novel, “The Dark is Rising Sequence” by Susan Cooper. In this fantasy work there are six signs: wood, bronze, iron, water, fire and stone. Their purpose has something to do with driving away the Dark. Here is a quote from the book that puts these six signs in some context:… Read More
The semiconductor industry is fiercely competitive. This is widely known by the SemiWiki community. When it comes to critical design parameters such as power, performance or area you’re either in the envelope that defines the market or you’re not a player. Yield management has a similar impact. Those who can stay ahead of the yield… Read More
In July, I covered a webinar that described how yieldHUB helps bring a new product to market. That webinar described how to implement new production introduction (NPI) using an array of tools and techniques that should be part of any semiconductor enterprise. In a recent article published by yieldHUB, they took a few steps back … Read More
One of the most important aspects of any manufacturing effort is the yield of the process. Today, the investment in facilities, equipment and materials is so high that consistently high yields are vital to the profitability of the semiconductor manufacturer. Furthermore, the engineers must get to that consistent high yield … Read More
It’s a fact that new process nodes come with some amount of yield challenges. One way to find and eliminate silicon defects is through diagnosis-driven yield analysis (DDYA), which is the topic of a free seminar by Mentor Graphics in Fremont this Thursday, October 10 from 11:30am – 2pm (yes, lunch is included because Mentor… Read More
Calling all Mentor users! Don’t forget to register for the U2U in San Jose on Thursday, April 25.
In addition to three worthy keynotes, you will find a more interactive and solution-focused day than in the past. There are sessions on place & route, custom/AMS, emulation, test and yield analysis, functional verification, Calibre… Read More
SEMICON West is coming up this July 10-12 at the Moscone Center in San Francisco. It covers a broad swath of the microelectronics supply chain, but I was particularly interested in the test sessions. Here are two that I recommend.
“The Value of Test for Semiconductor Yield Learning” on Tuesday, July 10, at 1:30p. The… Read More
