A better way to combine PVT and Monte Carlo to improve yield

A better way to combine PVT and Monte Carlo to improve yield
by Tom Simon on 10-11-2017 at 12:00 pm

TSMC held its Open Innovation Platform Forum the other week on September 13[SUP]th[/SUP]. Each year the companies that exhibit at this event choose to highlight their latest technology. One of the most interesting presentations that I received during the event was from Solido. In recent years they have produced a number of groundbreaking… Read More


CEO Interview: Alan Rogers of Analog Bits

CEO Interview: Alan Rogers of Analog Bits
by Daniel Nenni on 03-06-2017 at 7:00 am

It has been incredible to watch the Semiconductor IP market grow from millions to billions of dollars during my career in Silicon Valley. In fact, more than half of my professional experience involves IP so when I talk about what it takes to be successful it is certainly worth a listen.

In my opinion the key ingredient to a successful… Read More


The Latest in Static Timing Analysis with Variation Modeling

The Latest in Static Timing Analysis with Variation Modeling
by Tom Dillinger on 03-30-2016 at 12:00 pm

In many ways, static timing analysis (STA) is more of an art than a science. Methodologists are faced with addressing complex phenomena that impact circuit delay — e.g., signal crosstalk, dynamic I*R supply voltage drop, temperature inversion, device aging effects, and especially (correlated and uncorrelated) process… Read More


IP Market at Your Desk!

IP Market at Your Desk!
by Pawan Fangaria on 02-01-2015 at 4:00 pm

Semiconductors have played very important role in making internet successful and that has unleashed the potential of e-commerce. Today, we see names like Alibaba, whose primary focus is on commodity trade. I couldn’t imagine an e-commerce type of web portal for semiconductor services until I looked at the eSilicon website. … Read More


Coverage Driven Verification for Analog?

Coverage Driven Verification for Analog?
by Pawan Fangaria on 09-26-2014 at 1:00 am

We know there is a big divide between analog and digital design methodologies, level of automation, validation and verification processes, yet they cannot stay without each other because any complete system on a chip (SoC) demands them to be together. And therefore, there are different methodologies on the floor to combine analog… Read More


PVT and Statistical Design in Nanometer Process Geometries

PVT and Statistical Design in Nanometer Process Geometries
by Daniel Nenni on 09-18-2011 at 9:00 am

On Sept 22, 2011, the nm Circuit Verification Forumwill be held in Silicon Valley, hosted by Berkeley Design Automation. At this forum, Trent McConaghy of Solido DA will present a case study on the TSMC Reference Flow 2.0 VCO circuit, to showcase Fast PVT in the steps of extracting PVT corners, verifying PVT, and doing post-layout… Read More