S2C Accelerates Development Timeline of Bluetooth LE Audio SoC

S2C Accelerates Development Timeline of Bluetooth LE Audio SoC
by Daniel Nenni on 06-15-2023 at 6:00 am

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S2C has been shipping FPGA prototyping platforms for SoC verification for almost two decades, and many of its customers are developing SoCs and silicon IP for Bluetooth applications.  Prototyping Bluetooth designs before silicon has yielded improved design efficiencies through more comprehensive system validation, and… Read More


How to Efficiently and Effectively Secure SoC Interfaces for Data Protection

How to Efficiently and Effectively Secure SoC Interfaces for Data Protection
by Kalar Rajendiran on 01-04-2023 at 6:00 am

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Before the advent of the digitized society and computer chips, things that needed protection were mostly hard assets such as jewelry, coins, real estate, etc. Administering security was simple and depended on strong guards who provided security through physical means. Then came the safety box services offered by financial … Read More


Virtual Emulation Extends Debugging Over Physical

Virtual Emulation Extends Debugging Over Physical
by Pawan Fangaria on 12-13-2014 at 7:30 am

Amid burgeoning complexity of SoC verification with ever increasing hardware, software and firmware content, verification engineers are hard pressed with learning multiple tools, technologies and methodologies and still completing SoC verification with full accuracy in time. The complexity, size and diversity of SoC … Read More


Improve Test Robustness & Coverage Early in Design

Improve Test Robustness & Coverage Early in Design
by Pawan Fangaria on 11-03-2014 at 5:00 pm

In a semiconductor design, keeping the design testable with high test coverage has always been a requirement. However with shrinking technology nodes and large, dense SoC designs and complex logic structures, while it has become mandatory to reach close to 100% test coverage, it’s extremely difficult to cope with the explosion… Read More


Smart Strategies for Efficient Testing of 3D-ICs

Smart Strategies for Efficient Testing of 3D-ICs
by Pawan Fangaria on 02-12-2014 at 6:30 am

3D-IC has a stack of dies connected and packaged together, and therefore needs new testing strategies other than testing a single die. It’s given that a single defective die can render the whole of 3D-IC unusable, so each die in the stack must be completely and perfectly tested before its entry into that stack. Looking at it from a … Read More


DAC lunch seminar: Better IP Test with IEEE P1687

DAC lunch seminar: Better IP Test with IEEE P1687
by Beth Martin on 05-30-2013 at 7:28 pm

What: DAC lunch seminar (register here)
When: June 5, 2013, 11:30am – 1:30pm
Where: At DAC in lovely Austin, TX

Dr. Martin Keim of Mentor Graphics will present this overview of the new the IEEE P1687 standard, called IJTAG for ‘internal’ JTAG.

If you are involved in IC test*, you’ve probably heard about IJTAG. If you … Read More


IJTAG, Testing Large SoCs

IJTAG, Testing Large SoCs
by Paul McLellan on 11-08-2012 at 5:57 pm

Test is the Rodney Dangerfield of EDA, it doesn’t get any respect. All designs need to be tested but somehow synthesis, routing, analog layout and the rest are the sexy areas. In my spoof all purpose EDA keynote address I even dissed it:You are short on time so slip in a quick mention of manufacturing test. Who knows anything … Read More