Tag: emc

Webinar: Leveraging Simulation for Electromagnetic Shielding Optimization

Webinar: Leveraging Simulation for Electromagnetic Shielding Optimization
by Admin on 01-11-2023 at 3:28 pm

Proper electromagnetic (EM) shielding is often essential for electronics products to successfully comply with electromagnetic compatibility (EMC) standards. Metal enclosures are one of the most common approaches towards preventing radiated electromagnetic interference (EMI) that would cause test failures. However,… Read More

IEEE Israel Electromagnetic Compatibility, Signal & Power Integrity Conference

IEEE Israel Electromagnetic Compatibility, Signal & Power Integrity Conference
by Admin on 11-30-2022 at 12:24 pm

IEEE EMC & SI PI CONFERENCE, ISRAEL 2022

We are excited to invite you to the 2022 IEEE Israel Electromagnetic Compatibility, Signal & Power Integrity Conference, the biggest EMC SI/PI event in Israel. Meet world-leading EMC, SI/PI and PCB designers and get to know the local community.

This is an excellent opportunity

… Read More

Webinar: Foundations and Integrations of Ansys EMA3D Tools Part 2: EMC

Webinar: Foundations and Integrations of Ansys EMA3D Tools Part 2: EMC
by Admin on 08-22-2022 at 3:06 pm

This webinar, the second in a 3-part series, we’ll consider the means of using EMA3D electromagnetic simulation tools for EMC. The special capabilities of EMA3D tools will be brought to bear on electronics designs, in conjunction with the use of other Ansys tools to collaboratively optimize EMC for full systems.

TIME:

SEPTEMBER

… Read More

International Symposium and Exhibition on Electromagnetic Compatibility (EMC)

International Symposium and Exhibition on Electromagnetic Compatibility (EMC)
by Admin on 08-22-2022 at 1:54 pm

September 5-8, 2022, Gothenburg

EMC Europe, the leading EMC Symposium in Europe, will be held at The Swedish Exhibition & Congress Centre in Gothenburg, Sweden, in September 5-8, 2022. We wish to invite and encourage all those working in the area of electromagnetic compatibility to participate in this prestigious event.

… Read More

New, Powerful Ansys Electromagnetic Capabilities for EMI/EMC Simulations

New, Powerful Ansys Electromagnetic Capabilities for EMI/EMC Simulations
by Admin on 10-06-2020 at 2:36 pm

October 26, 2020

2:00 PM (GMT) / 3:00 PM (CET)

Venue:
Online

Does EMI keep you awake at night?  Leading companies are reducing EMI/EMC test cycles by leveraging simulation technologies.  This webinar will show how a slew of new Ansys Electromagnetic capabilities can be leveraged to remove your fear of EMI testing and replace it

… Read More
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Getting to EMC Compliance by Design

Getting to EMC Compliance by Design
by Bernard Murphy on 05-15-2019 at 7:00 am
Categories: Ansys, Inc., Automotive, EDA

At the risk of highlighting my abundant lack of expertise in the domain, I had always viewed EMC (electromagnetic compatibility) compliance and testing as one of those back-end exercises that can only be done on the real device and depends on a combination of expertise and brute-force in chip/package/module/system design (decaps,… Read More

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Reliability Signoff for FinFET Designs

Reliability Signoff for FinFET Designs
by Bernard Murphy on 10-17-2017 at 7:00 am
Categories: Ansys, Inc., Automotive, EDA, TSMC

Ansys recently hosted a webinar on reliability signoff for FinFET-based designs, spanning thermal, EM, ESD, EMC and aging effects. I doubt you’re going to easily find a more comprehensive coverage of reliability impact and analysis solutions. If you care about reliability in FinFET designs, you might want to check out this webinar.… Read More

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Simulating ADAS

Simulating ADAS
by Bernard Murphy on 05-04-2017 at 7:00 am
Categories: Ansys, Inc., Automotive, EDA, IoT

Simulation is a broad technique spanning certainly digital logic and circuit simulation but also methods beyond these which are particularly relevant to ADAS design. In fact, much of the design of full ADAS systems begins and ends with these types of modeling. This is in part due to the need fully validate integrity and reliability… Read More