Webinar: Electrothermal Signoff for 2.5D and 3D IC Systems

Webinar: Electrothermal Signoff for 2.5D and 3D IC Systems
by Mike Gianfagna on 02-08-2021 at 6:00 am

Webinar Electrothermal Signoff for 2.5D and 3D IC Systems

The move from single-chip design to system-in-package design has created many challenges. The rise of 2.5D and 3D technology has set the stage for this. Beyond the modeling requirements and the need for ecosystem collaboration to get those models, there is a significant challenge in understanding the data. The only way to truly… Read More


Ansys Multiphysics Platform Tackles Power Management ICs

Ansys Multiphysics Platform Tackles Power Management ICs
by Mike Gianfagna on 07-14-2020 at 10:00 am

Screen Shot 2020 07 08 at 7.14.17 PM

Ansys addresses complex Multiphysics simulation and analysis tasks, from device to chip to package and system. When I was at eSilicon we did a lot of work on 2.5D packaging and I can tell you tools from Ansys were a critical enabler to get the chip, package and system to all work correctly.

Ansys recently published an Application Brief… Read More


Package Reliability Issues Cost Money

Package Reliability Issues Cost Money
by Tom Dillinger on 11-13-2019 at 6:00 am

Advanced packaging technology is enabling “More Than Moore” scaling of heterogeneous technology die.  At the recent EDPS Symposium in Milpitas, Craig Hillman, Director of Product Development, DfR Solutions, at ANSYS gave a compelling presentation, “Reliability Challenges in Advanced Packaging”.  The key takeaway messages… Read More


5G Deployments – The Analysis Requirements are Ginormous

5G Deployments – The Analysis Requirements are Ginormous
by Tom Dillinger on 10-07-2019 at 10:00 am

The introduction of 5G communications support offers tremendous potential across a broad spectrum of applications (no pun intended).  5G is indeed quite encompassing, across a wide range of frequencies – the figure below illustrates the common terminology used, from low-band, mid-band (“sub 6G”), and high-band (“mmWave”)… Read More