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Q2FY24TessentAI 800X100
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Mentor DefectSim Seen as Breakthrough for AMS Test

Mentor DefectSim Seen as Breakthrough for AMS Test
by Mitch Heins on 11-21-2016 at 4:00 pm

For decades, digital test has been fully automated including methodologies and automation for test pattern generation, grading and test time compression. Automation for analog and mixed-signal (AMS) IC test has not however kept pace. This is troubling as according to IBSapproximately 85% of SoC design starts are now AMS designs.… Read More


Optimizing Prototype Debug

Optimizing Prototype Debug
by Bernard Murphy on 11-09-2016 at 7:00 am

In the spectrum of functional verification platforms – software-based simulation, emulation and FPGA-based prototyping – it is generally agreed that while speed shoots up by orders of magnitude (going left to right) ease of debug drops as performance rises and setup time increases rapidly, from close to nothing for simulation… Read More


How to nail your PPA tradeoffs

How to nail your PPA tradeoffs
by Beth Martin on 11-03-2016 at 4:00 pm

How do you ensure your design has been optimized for power, performance, and area? I posed this question to Mentor’s Group Director of Marketing, Sudhakar Jilla and product specialist Mark Le. They said that finding the PPA sweet spot is still often done by trial and error – basically serial experiments with various input parameters… Read More


Keeping It Fresh with the Veloce Deterministic ICE App

Keeping It Fresh with the Veloce Deterministic ICE App
by Rizwan Farooq on 11-02-2016 at 4:00 pm

In The Times They Are A Changin’ Nobel Laureate Bob Dylan advised us to “heed the call” of change or suffer the consequences. This couldn’t be more true, considering what design and verification engineers face every day in the midst of the technological revolution.

Change has never been so rapid. And it requires we constantly adapt.… Read More


IoT From SEMI Meeting: EDA, Image Sensors, MEMS

IoT From SEMI Meeting: EDA, Image Sensors, MEMS
by Daniel Payne on 11-01-2016 at 12:00 pm

Last Friday I learned something new about IoT by attending a SEMI event in Wilsonville, OR just a few short miles away from where I live in Tualatin. SEMI puts on two events here in Oregon each year, and their latest event on IoT Sensors was quite timely and popular judging by how many attendees showed up. First up was Jeff Miller from … Read More


Can one flow bring four domains together?

Can one flow bring four domains together?
by Don Dingee on 10-28-2016 at 4:00 pm

IoT edge device design means four domains – MEMS, analog, digital, and RF – not only work together, but often live on the same die (or substrate in a 2.5D process) and are optimized for power and size. Getting these domains to work together effective calls for an enhanced flow.

Historically, these domains have not played together … Read More


Mentor Webinar Series: Integrating the Systems Engineering Flow

Mentor Webinar Series: Integrating the Systems Engineering Flow
by Bernard Murphy on 10-28-2016 at 7:00 am

Product lifecycle management is probably not the most gripping topic for most design engineers. You want to get on with architecture, design, verification and implementation. But if you are building products for any safety-sensitive application in a car, a medical appliance, avionics, railway applications in Europe – to name… Read More


Manufacturing Singularity is Comng!

Manufacturing Singularity is Comng!
by Daniel Nenni on 10-27-2016 at 12:00 pm

One of the many benefits of blogging is that you get to meet some very interesting people. This time I had the pleasure of speaking with Michael Ford of Mentor Graphics about Industry 4.0 and smart factories. In fact, Mentor has an excellent series of white papers titled “Is This a Manufacturing Revolution?” from their Valor Division,… Read More


Automation for managed system-of-systems design

Automation for managed system-of-systems design
by Don Dingee on 10-26-2016 at 4:00 pm

Anybody who has done any bus & board system design knows the problem. Merchant boards typically have standardized pinouts (after years of haggling in standards organizations) for the backplane bus, and a group of user-defined pins for daughtercard I/O. Homegrown systems usually have a just-as-carefully defined proprietary… Read More


DFT Approaches for Giga-gate SoC Designs

DFT Approaches for Giga-gate SoC Designs
by Daniel Payne on 10-26-2016 at 12:00 pm

In the early days of IC design there were arguments against using any extra transistors or gates for testability purposes, because that would be adding extra silicon area which in turn would drive up the costs of the chip and product. Today we are older and wiser, realizing that there are product pricing benefits to quickly test each… Read More