Noise & Reliability of FinFET Designs – Success Stories!

Noise & Reliability of FinFET Designs – Success Stories!
by Pawan Fangaria on 11-01-2014 at 7:00 am

I think by now there has been good level of discussion on FinFET technology at sub-20 nm process nodes and this is an answer to ultra dense, high performance, low power, and billion+ gate SoC designs within the same area. However, it comes with some of the key challenges with respect to power, noise and reliability of the design. A FinFET… Read More


A Comprehensive Power Analysis Solution for SoC+Package

A Comprehensive Power Analysis Solution for SoC+Package
by Pawan Fangaria on 09-08-2014 at 4:00 pm

Since power has become a critical factor in semiconductor chip design, the stress is towards decreasing supply voltage to reduce power consumption. However, the threshold voltage to switch devices cannot go down beyond a certain limit and these results in an extremely narrow margin for noise between the two. And that gets further… Read More


First low-power webinar: Ultra-low-power Methodology

First low-power webinar: Ultra-low-power Methodology
by Paul McLellan on 07-13-2011 at 12:10 pm

The first of the low power webinars is coming up on July 19th at 11am Pacific time. The webinar will be conducted by Preeti Gupta, Sr. Technical Marketing Manager at Apache Design Solutions. Preeti has 10 years of experience in the exciting world of CMOS power. She has a Masters in Electrical Engineering from Indian Institute of technology,… Read More