Tessent SiliconInsight ATE-Connect: Bending the bring up schedule curve in your favor

Tessent SiliconInsight ATE-Connect: Bending the bring up schedule curve in your favor
by Admin on 06-23-2020 at 8:00 am

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Online – Jun 16, 2020
5:00 PM – 6:00 PM US/Pacific

Online – Jun 23, 2020
8:00 AM – 9:00 AM US/Pacific

Overview

With  the number of IP blocks and complexity of designs increasing, how do you improve your TTM for debug of a test program to production?  Teradyne

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DFT Innovations Come from Customer Partnerships

DFT Innovations Come from Customer Partnerships
by Tom Simon on 05-05-2020 at 10:00 am

Mentro Tessent Innovation

There is an adage that says that quality is not something that can be slapped on at the end of the design or manufacturing process. Ensuring quality requires careful thought throughout development and production. Arguably this adage is more applicable to the topic of Design for Test (DFT) than almost any other area of IC development… Read More


Bringing Hierarchy to DFT

Bringing Hierarchy to DFT
by Tom Simon on 01-30-2020 at 6:00 am

Tessent Hierarchical Flow

Hierarchy is nearly universally used in the SoC design process to help manage complexity. Dealing with flat logical or physical designs proved unworkable decades ago. However, there were a few places in the flow where flat tools continued to be used. Mentor lead the pack in the years around 1999 in helping the industry move from … Read More


Full Solution for eMRAM Coming in 2020

Full Solution for eMRAM Coming in 2020
by Tom Simon on 12-19-2019 at 6:00 am

Trimming for eMRAM in Tessent

It’s amazing to think that Apollo moon mission used computers that were based on magnetic core memories. Of course, CMOS memories superseded them rapidly. However, over the decades since, memory technologies have advanced significantly, in terms of density, power and new types of technologies, e.g NAND Flash. Ever since the… Read More


Automotive Market Pushing Test Tool Capabilities

Automotive Market Pushing Test Tool Capabilities
by Tom Simon on 07-09-2019 at 8:00 am

It’s easy to imagine that the main impetus for automotive electronics safety standards like ISO 26262 is the emergence of autonomous driving technology. However, even cars that do not offer this capability rely heavily on electronics for many critical systems. These include engine control, braking, crash sensors, and stability… Read More


Hierarchical RTL Based ATPG for an ARM A75 Based SOC

Hierarchical RTL Based ATPG for an ARM A75 Based SOC
by Tom Simon on 03-27-2019 at 5:00 am

Two central concepts have led to the growth of our ability to manage and implement larger and larger designs: hierarchy and higher levels of abstraction. Without these two approaches the enormous designs we are seeing in SOCs would not be possible. Hierarchy in particular allows the reuse of component blocks, such as CPU cores.… Read More


Accelerating Post-Silicon Debug and Test

Accelerating Post-Silicon Debug and Test
by Alex Tan on 02-22-2019 at 7:00 am

The recent growing complexity in SoC designs attributed to the increased use of embedded IP’s for more design functionalities, has imposed a pressing challenge to the post-silicon bring-up process and impacting the overall product time-to-market.

According to data from Semico Research, more than 60% of design starts contain… Read More


How to be Smart About DFT for AI Chips

How to be Smart About DFT for AI Chips
by Tom Simon on 01-31-2019 at 12:00 pm

We have entered the age of AI specific processors, where specialized silicon is being produced to tackle the compute needs of AI. Whether they use GPUs, embedded programmable logic or specialized CPUs, many AI chips are based on parallel processing. This makes sense because of the parallel nature of AI computing. As a result, in… Read More


Mentor Tessent MissionMode Provides Runtime DFT for Self-Correcting Automotive ICs

Mentor Tessent MissionMode Provides Runtime DFT for Self-Correcting Automotive ICs
by Mitch Heins on 02-22-2018 at 12:00 pm

The automotive industry continues push the limits on how “smart” we can make our vehicles and from that, it follows as to how smart we can make the electronics in the vehicles. When I think of smart cars (and smart automotive ICs) I typically think of things like advanced driver-assistance systems (ADAS) that use AI and neural networks… Read More


Automotive IC Design Requires a Unique EDA Tool Emphasis

Automotive IC Design Requires a Unique EDA Tool Emphasis
by Tom Dillinger on 08-14-2017 at 12:00 pm

Semiwiki readers are no doubt very familiar with the increasing impact of the automotive market on the semiconductor industry. The magnitude and complexity of the electronic systems that will be integrated into upcoming vehicle designs reflects the driver automation, safety, and entertainment features that are in growing… Read More