Closing the Stochastics Resolution Gap

Closing the Stochastics Resolution Gap
by Admin on 07-20-2025 at 6:00 am

Closing the Stochastics Resolution Gap

The relentless miniaturization of semiconductor devices has always relied on achieving ever-smaller features on silicon wafers. However, as the industry enters the realm of extreme ultraviolet (EUV) lithography, it faces a critical barrier: stochastics, or the inherent randomness in patterning at atomic scales. This phenomenon… Read More


EUV faces Scylla and Charybdis

EUV faces Scylla and Charybdis
by Fred Chen on 08-03-2020 at 6:00 am

EUV faces Scylla and Charybdis

It is now time for the EUV community to realize they are caught between the proverbial Scylla and Charybdis. In Greek mythology, the two monsters terrorized ships that were unlucky enough to pass between them. By avoiding one, you approached the other.

S for Scylla, or Stochastics

Scylla was a former beautiful nymph turned into

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The Need for Low Pupil Fill in EUV Lithography

The Need for Low Pupil Fill in EUV Lithography
by Fred Chen on 03-15-2020 at 10:00 am

The Need for Low Pupil Fill in EUV Lithography 1

Extreme ultraviolet (EUV) lithography targets sub-20 nm resolution using a wavelength range of ~13.3-13.7 nm (with some light including DUV outside this band as well) and a reflective ring-field optics system. ASML has been refining the EUV tool platform, starting with the NXE:3300B, the very first platform with a numerical

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