CEO Interview: Dr. Meghali Chopra of Sandbox Semiconductor

CEO Interview: Dr. Meghali Chopra of Sandbox Semiconductor
by Daniel Nenni on 11-24-2023 at 6:00 am

MeghaliChopra highres cropped

Dr. Meghali Chopra is co-founder and CEO of SandBox Semiconductor. She is responsible for SandBox’s vision and strategy and oversees the development of SandBox’s software products and technologies. Dr. Chopra received her PhD in Chemical Engineering from the University of Texas at Austin where her research focused … Read More


An Update on In-Line Wafer Inspection Technology

An Update on In-Line Wafer Inspection Technology
by Tom Dillinger on 06-06-2022 at 6:00 am

inspection overview

From initial process technology development (TD) to high volume manufacturing (HVM) status for a new node, one of the key support functions to improve and maintain yield is the in-line wafer inspection technology.  Actually, there are multiple inspection technologies commonly employed, with tradeoffs in pixel resolution,… Read More


A Compelling Application for AI in Semiconductor Manufacturing

A Compelling Application for AI in Semiconductor Manufacturing
by Tom Dillinger on 07-06-2020 at 6:00 am

AI opportunities

There have been a multitude of announcements recently relative to the incorporation of machine learning (ML) methods into EDA tool algorithms, mostly in the physical implementation flows.  For example, deterministic ML-based decision algorithms applied to cell placement and signal interconnect routing promise to expedite… Read More


A Powerful Case for the ARC SEM Processor

A Powerful Case for the ARC SEM Processor
by Bernard Murphy on 09-12-2016 at 8:06 am

Building devices for the IoT has become especially challenging thanks to two conflicting requirements. The device has to be small and ultra-low power in most applications but also in many of those applications it has to provide a high-level of security, especially to defend high-value targets like smart metering, payment terminals,… Read More


Challenges in IP Qualification with Rising Physical Data

Challenges in IP Qualification with Rising Physical Data
by Pawan Fangaria on 12-17-2015 at 7:00 am

With every new technology node, there are newer physical effects that need to be taken into account. And every new physical effect brings with itself several new formats to model them. Often a format is also associated with several of its derivatives, sometimes an standard reincarnation of a proprietary format further evolved… Read More


Evaluate MEMS Devices out-of-fab Before Fabrication

Evaluate MEMS Devices out-of-fab Before Fabrication
by Pawan Fangaria on 03-21-2014 at 10:30 am

MEMS design and fabrication is highly complex in the sense that the fabrication process heavily depends on the design, unlike IC fabrication which has a standard set of processes. A slight change in MEMS design can alter its fabrication steps to a large extent. For example, setting device parameters such as capacitance or linear… Read More


How to Quickly Optimize BEOL Process at Your Desk?

How to Quickly Optimize BEOL Process at Your Desk?
by Pawan Fangaria on 09-30-2013 at 11:00 am

Engineers are always looking to improve the efficiency of how they work, but don’t want to sacrifice accuracy in the process. This is true in the world of semiconductor process development, where traditional build-and-test cycles are both time and resource intensive. But what if there was a way to do certain steps in a ‘virtual’… Read More


Rapid Yield Optimization at 22nm Through Virtual Fab

Rapid Yield Optimization at 22nm Through Virtual Fab
by Pawan Fangaria on 09-09-2013 at 10:00 am

Remember? During DAC2013 I talked about a new kind of innovation: A Virtual Fabrication Platform, SEMulator3D, developed by COVENTOR. Now, to my pleasant surprise, there is something to report on the proven results from this platform. IBM, in association with COVENTOR, has successfully implemented a 3D Virtual Fabrication… Read More