The cost of an IC depends on many factors like: NRE, masks, fabrication, testing, packaging. Product engineers are tasked with testing each part and understanding what exactly is limiting the yields. Every company has a methodology for Physical Failure Analysis (PFA), and the challenge is to make this process as quick as possible,… Read More
Naturally, chips that fail test are a curse, however with the advent of Scan Logic Diagnosis these failures can become a blessing in disguise. Through this technique information gleaned from multiple tester runs can help pin down the locations of defects. Initially tools that did Scan Logic Diagnosis relied on the netlist to filter… Read More
Finding and debugging failures on integrated circuits has become increasingly difficult. Two sessions at ISTFA (International Symposium for Testing and Failure Analysis) on Thursday address the current best practices and research directions of diagnosis.
The first was a tutorial this morning by Mentor Graphics luminary… Read More
