Xilinx & Apache Team up for FPGA Reliability at 20nm

Xilinx & Apache Team up for FPGA Reliability at 20nm
by Pawan Fangaria on 03-17-2014 at 12:00 am

In this age of SoCs with hundreds of IPs from different sources integrated together and working at high operating frequencies, FPGA designers are hard pressed keeping up the chip reliability from issues arising out of excessive static & dynamic IR drop, power & ground noise, electro migration and so on. While the IPs are… Read More


How to Assure Quality of Power and SI Verification?

How to Assure Quality of Power and SI Verification?
by Pawan Fangaria on 12-08-2013 at 10:05 am

As power has become one of the most important criteria in semiconductor design today, I was wondering whether there is a standard set for the power verification for an overall chip. We do have formats evolved like CPF and UPF and there are tools available to check power and signal integrity (SI), however I don’t see a standard objective… Read More


Reliability sign-off has several aspects – One Solution

Reliability sign-off has several aspects – One Solution
by Pawan Fangaria on 09-01-2013 at 5:00 pm

Here, I am talking about reliability of chip design in the context of electrical effects, not external factors like cosmic rays. So, the electrical factors that could affect reliability of chips could be excessive power dissipation, noise, EM (Electromigration), ESD (Electrostatic Discharge), substrate noise coupling and… Read More


Designing for Reliability

Designing for Reliability
by Paul McLellan on 04-08-2012 at 8:06 pm

Analyzing the operation of a modern SoC, especially analyzing its power distribution network (PDN) is getting more and more complex. Today’s SoCs no longer operate on a continuous basis, instead functional blocks on the IC are only powered up to execute the operation that is required and then they go into a standby mode, … Read More


Noise Coupling

Noise Coupling
by Paul McLellan on 10-24-2011 at 8:47 am

One of the challenges of designing a modern SoC is that the digital parts of the circuit are really something that in an ideal world you’d keep as far away from the analog as possible. The digital parts of the circuit generate large amounts of noise, especially in the power supply and in the substrate, two areas where it is impossible… Read More


2.5D and 3D designs

2.5D and 3D designs
by Paul McLellan on 09-07-2011 at 1:54 pm

Going up! Power and performance issues, along with manufacturing yield issues, limit how much bigger chips can get in two dimensions. That, and the fact that you can’t manufacture two different processes on the same wafer, mean that we are going up into the third dimension.

The simplest way is what is called package-in-package… Read More


Totem webinar: Analog/Mixed-Signal Power Noise and Reliability

Totem webinar: Analog/Mixed-Signal Power Noise and Reliability
by Paul McLellan on 07-30-2011 at 5:26 pm

The Totem webinar will be at 11am on Tuesday 2nd August. This session will be conducted by Karan Sahni, Senior Applications Engineer at Apache Design Solutions. Karan has been with Apache since 2008, supporting the Redhawk, Totem, Sentinel product lines. He received his MS in Electrical Engineering from the Syracuse University… Read More