Radiation Tolerance. Not Just for ISO 26262

Radiation Tolerance. Not Just for ISO 26262
by Bernard Murphy on 04-30-2020 at 6:00 am

Satellite

Years before ISO 26262 (the auto safety standard) existed, a few electronics engineers had to worry about radiation hardening, but not for cars. Their concerns were the same we have today – radiation-induced single event effects (SEE) and single event upsets (SEU). SEEs are root-cause effects – some form of radiation, might be… Read More


Mentor Showcases Digital Twin Demo

Mentor Showcases Digital Twin Demo
by Bernard Murphy on 03-06-2019 at 6:00 am

Mentor put on a very interesting tutorial at DVCon this year. Commonly DVCon tutorials center around a single tool; less commonly (in my recent experience) they will detail a solution flow but still within the confines of chip or chip + software design. It is rare indeed to see presentations on a full system design including realistic… Read More