Supernovae and Safety

Supernovae and Safety
by Bernard Murphy on 02-05-2016 at 7:00 am

Whenever we push the bounds of reliability in any domain, we run into new potential sources of error. Perhaps not completely new, but rather concerns new to that domain. That’s the case for Single Event Upsets (SEUs) which are radiation-triggered bit-flips, and Single Event Transients (SETs) which are radiation-triggered pulses… Read More


Auto Introspection

Auto Introspection
by Bernard Murphy on 12-20-2015 at 4:00 pm

It is an indictment of our irrationality that our cars are now more health-conscious than we are. Increasingly safety-conscious readings of the ISO26262 standard now encourage that safety-critical electronics (anti-lock braking control for example) automatically self-test, not just at power-on but repeatedly as the car… Read More


Automotive MCU code fault-busting with vHIL

Automotive MCU code fault-busting with vHIL
by Don Dingee on 09-30-2015 at 7:00 pm

With electronic and software content in vehicles skyrocketing, and the expectations for flawless operation getting larger, the need for system-level verification continues to grow. Last month, we looked at a Synopsys methodology for virtual hardware in the loop, or vHIL… Read More


ARC EM SEP Processor, Safety Ready Solution for Automotive

ARC EM SEP Processor, Safety Ready Solution for Automotive
by Eric Esteve on 10-30-2013 at 5:24 am

If you are familiar with Processor IP core, you certainly know DesignWare ARC EM4 core, 32-bit CPU that SoC designers can optimize for a wide range of uses, and differentiate by using patented configuration technology to tailor each ARC core instance to meet specific performance, power and area requirements. If you develop a product… Read More