From Process Learning to Production Control: Characterization for the Era of Heterogeneous Systems

From Process Learning to Production Control: Characterization for the Era of Heterogeneous Systems
by Kalar Rajendiran on 07-27-2026 at 6:00 am

Chiplets Have Changed the Test Paradigm

Every generation of semiconductor innovation has relied on one fundamental principle: before a technology can be manufactured at scale, it must first be understood. That understanding comes through characterization.

For decades, characterization enabled process learning. It helped engineers understand transistor behavior,… Read More


3DIC Design, Implementation, and (especially) Test

3DIC Design, Implementation, and (especially) Test
by Tom Dillinger on 12-20-2020 at 8:00 am

IO cell

The introduction of direct die-to-die bonding technology into high volume production has the potential to substantially affect the evolution of the microelectronics industry.  The concerns relative to the “end of Moore’s Law”, the diminishing returns of continued (monolithic) CMOS process scaling, and the disruptive effect… Read More