FinFET Design for Power, Noise and Reliability

FinFET Design for Power, Noise and Reliability
by Daniel Payne on 08-29-2014 at 4:00 pm

IC designers have been running analysis tools for power, noise and reliability for many years now, so what is new when you start using FinFET transistors instead of planar transistors? Calvin Chow from ANSYS (Apache Design) presented on this topic earlier in the summer through a 33 minutewebinar that has been archived. There is… Read More