Measuring Local EUV Resist Blur with Machine Learning

Measuring Local EUV Resist Blur with Machine Learning
by Fred Chen on 03-17-2024 at 10:00 am

Measuring Local EUV Resist Blur with Machine Learning

Resist blur remains a topic that is relatively unexplored in lithography. Blur has the effect of reducing the difference between the maximum and minimum doses in the local region containing the feature. Blur is particularly important for EUV lithography since EUV lithography is prone to stochastic fluctuations and also driven… Read More