Image Sensors will take place in London, UK, 11-12 March 2020 and offers end-users in all the main applications, camera system suppliers, sensor design houses and technology developers, optics suppliers the chance to:
- Network with over 240 attendees from across the image sensing value chain
- Hear from companies who are leaders
… Read More
The DATE exhibition will run for three days (Tuesday-Thursday). The spacious exhibition area will be located close to the conference rooms in the heart of the Congress Center. As the area is positioned centrally and will host the coffee and lunch break area as well, a constant frequentation will be guaranteed.
DATE also arranges… Read More
I just read Daniel Nenni’s blog titled “Is Silicon Valley Gridlock a Good Sign for Semiconductors?” Dan, there is no definitive answer to this, I mean in terms of semiconductors. Let me call it Semiconductor Gridlock in Silicon Valley. Yes it’s good because Silicon Valley promotes research, brings up innovative technology and… Read More
The Jasper European User Group meeting (EJUG) is coming up in a couple of weeks. It will be held in the Munich Hilton (which I have stayed in many times, the S-bahn from the airport pretty much stops in the basement) on April 2nd.
The schedule for the day is:
9:00 AM – Registration and continental breakfast
9:30 AM – Jasper… Read More
The first week of June is DAC in Austin of course. But over in Europe, the Wednesday and Thursday of that week, June 5-6th is the GSA European Executive Forum, bringing C-level executives together from all over Europe. It actually runs from 2pm on Wednesday until about 2pm on Thursday including a VIP dinner on Wednesday evening sponsored… Read More
ST Microelectronics announced yesterday that it would have a conference call on December 10th to announce its strategy going forward. ST has been struggling the last couple of years, with revenues down year to year. From 2010-2012 (the last an estimate of course) it did $10.3B, $9.6B and $8.4B so it has shrunk nearly 20% in 3 years.… Read More